% IMPORTANT: The following is UTF-8 encoded. This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.
@ARTICLE{Schorn:50489,
author = {Schorn, J. and Böttger, U. and Waser, R.},
title = {{M}onte {C}arlo simulations of imprint behavior in
ferroelectrics},
journal = {Applied physics letters},
volume = {87},
issn = {0003-6951},
address = {Melville, NY},
publisher = {American Institute of Physics},
reportid = {PreJuSER-50489},
pages = {242902},
year = {2005},
note = {Record converted from VDB: 12.11.2012},
abstract = {In this letter, Monte Carlo simulation methods were used to
investigate the influence of the defect orientation and
concentration on the hysteresis loop in ferroelectric thin
films. The hysteresis loops were calculated by an existing
Monte Carlo model. For a certain type of defect orientation,
the simulations revealed an asymmetric hysteresis loop
behavior, similar to hysteresis curves recorded by imprint
measurements. Though these results may not directly offer a
new explanation for the imprint mechanism in ferroelectric
thin films, they still provide insight information about the
often observed phenomenon of imprinted hysteresis loops of
as-prepared thin-film capacitors.},
keywords = {J (WoSType)},
cin = {IFF-IEM / CNI},
ddc = {530},
cid = {I:(DE-Juel1)VDB321 / I:(DE-Juel1)VDB381},
pnm = {Materialien, Prozesse und Bauelemente für die Mikro- und
Nanoelektronik},
pid = {G:(DE-Juel1)FUEK252},
shelfmark = {Physics, Applied},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000233825900070},
doi = {10.1063/1.2140076},
url = {https://juser.fz-juelich.de/record/50489},
}