%0 Journal Article
%A Peter, F.
%A Rüdiger, A.
%A Waser, R.
%T Mechanical Crosstalk between Vertical and Lateral Piezoresponse Force Microscopy
%J Review of scientific instruments
%V 77
%@ 0034-6748
%C [S.l.]
%I American Institute of Physics
%M PreJuSER-50808
%P 036103
%D 2006
%Z Record converted from VDB: 12.11.2012
%X Piezoresponse force microscopy (PFM) provides valuable insight into the inverse lateral and vertical piezoelectric effects on the nanoscale. Ideally, these contributions are separated into vertical and lateral detections of a deflected laser beam on a quadrupole diode. In contrast to the known crosstalk by a rotated diode that causes identical signals in both channels, we report on the crosstalk due to the geometrical constraints of the cantilever that is inherent to the lateral PFM. For a BaTiO3 (001) nanograin we show that the vertical response attributable to the crosstalk is 1/8th of the lateral response. From this value we deduce the actual mechanism responsible for the crosstalk. (c) 2006 American Institute of Physics.
%K J (WoSType)
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000236739100055
%R 10.1063/1.2176081
%U https://juser.fz-juelich.de/record/50808