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000050808 084__ $$2WoS$$aInstruments & Instrumentation
000050808 084__ $$2WoS$$aPhysics, Applied
000050808 1001_ $$0P:(DE-Juel1)VDB42216$$aPeter, F.$$b0$$uFZJ
000050808 245__ $$aMechanical Crosstalk between Vertical and Lateral Piezoresponse Force Microscopy
000050808 260__ $$a[S.l.]$$bAmerican Institute of Physics$$c2006
000050808 300__ $$a036103
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000050808 440_0 $$05309$$aReview of Scientific Instruments$$v77$$x0034-6748
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000050808 520__ $$aPiezoresponse force microscopy (PFM) provides valuable insight into the inverse lateral and vertical piezoelectric effects on the nanoscale. Ideally, these contributions are separated into vertical and lateral detections of a deflected laser beam on a quadrupole diode. In contrast to the known crosstalk by a rotated diode that causes identical signals in both channels, we report on the crosstalk due to the geometrical constraints of the cantilever that is inherent to the lateral PFM. For a BaTiO3 (001) nanograin we show that the vertical response attributable to the crosstalk is 1/8th of the lateral response. From this value we deduce the actual mechanism responsible for the crosstalk. (c) 2006 American Institute of Physics.
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000050808 7001_ $$0P:(DE-Juel1)VDB26957$$aRüdiger, A.$$b1$$uFZJ
000050808 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b2$$uFZJ
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