TY  - JOUR
AU  - Peter, F.
AU  - Rüdiger, A.
AU  - Waser, R.
TI  - Mechanical Crosstalk between Vertical and Lateral Piezoresponse Force Microscopy
JO  - Review of scientific instruments
VL  - 77
SN  - 0034-6748
CY  - [S.l.]
PB  - American Institute of Physics
M1  - PreJuSER-50808
SP  - 036103
PY  - 2006
N1  - Record converted from VDB: 12.11.2012
AB  - Piezoresponse force microscopy (PFM) provides valuable insight into the inverse lateral and vertical piezoelectric effects on the nanoscale. Ideally, these contributions are separated into vertical and lateral detections of a deflected laser beam on a quadrupole diode. In contrast to the known crosstalk by a rotated diode that causes identical signals in both channels, we report on the crosstalk due to the geometrical constraints of the cantilever that is inherent to the lateral PFM. For a BaTiO3 (001) nanograin we show that the vertical response attributable to the crosstalk is 1/8th of the lateral response. From this value we deduce the actual mechanism responsible for the crosstalk. (c) 2006 American Institute of Physics.
KW  - J (WoSType)
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000236739100055
DO  - DOI:10.1063/1.2176081
UR  - https://juser.fz-juelich.de/record/50808
ER  -