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@ARTICLE{Peter:50808,
author = {Peter, F. and Rüdiger, A. and Waser, R.},
title = {{M}echanical {C}rosstalk between {V}ertical and {L}ateral
{P}iezoresponse {F}orce {M}icroscopy},
journal = {Review of scientific instruments},
volume = {77},
issn = {0034-6748},
address = {[S.l.]},
publisher = {American Institute of Physics},
reportid = {PreJuSER-50808},
pages = {036103},
year = {2006},
note = {Record converted from VDB: 12.11.2012},
abstract = {Piezoresponse force microscopy (PFM) provides valuable
insight into the inverse lateral and vertical piezoelectric
effects on the nanoscale. Ideally, these contributions are
separated into vertical and lateral detections of a
deflected laser beam on a quadrupole diode. In contrast to
the known crosstalk by a rotated diode that causes identical
signals in both channels, we report on the crosstalk due to
the geometrical constraints of the cantilever that is
inherent to the lateral PFM. For a BaTiO3 (001) nanograin we
show that the vertical response attributable to the
crosstalk is 1/8th of the lateral response. From this value
we deduce the actual mechanism responsible for the
crosstalk. (c) 2006 American Institute of Physics.},
keywords = {J (WoSType)},
cin = {IFF-IEM / CNI / JARA-FIT},
ddc = {530},
cid = {I:(DE-Juel1)VDB321 / I:(DE-Juel1)VDB381 /
$I:(DE-82)080009_20140620$},
pnm = {Grundlagen für zukünftige Informationstechnologien},
pid = {G:(DE-Juel1)FUEK412},
shelfmark = {Instruments $\&$ Instrumentation / Physics, Applied},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000236739100055},
doi = {10.1063/1.2176081},
url = {https://juser.fz-juelich.de/record/50808},
}