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001     50808
005     20200423204321.0
017 _ _ |a This version is available at the following Publisher URL: http://rsi.aip.org
024 7 _ |a 10.1063/1.2176081
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024 7 _ |a WOS:000236739100055
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024 7 _ |a 2128/1025
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041 _ _ |a eng
082 _ _ |a 530
084 _ _ |2 WoS
|a Instruments & Instrumentation
084 _ _ |2 WoS
|a Physics, Applied
100 1 _ |a Peter, F.
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|u FZJ
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245 _ _ |a Mechanical Crosstalk between Vertical and Lateral Piezoresponse Force Microscopy
260 _ _ |a [S.l.]
|b American Institute of Physics
|c 2006
300 _ _ |a 036103
336 7 _ |a Journal Article
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336 7 _ |a Journal Article
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336 7 _ |a article
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440 _ 0 |a Review of Scientific Instruments
|x 0034-6748
|0 5309
|v 77
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a Piezoresponse force microscopy (PFM) provides valuable insight into the inverse lateral and vertical piezoelectric effects on the nanoscale. Ideally, these contributions are separated into vertical and lateral detections of a deflected laser beam on a quadrupole diode. In contrast to the known crosstalk by a rotated diode that causes identical signals in both channels, we report on the crosstalk due to the geometrical constraints of the cantilever that is inherent to the lateral PFM. For a BaTiO3 (001) nanograin we show that the vertical response attributable to the crosstalk is 1/8th of the lateral response. From this value we deduce the actual mechanism responsible for the crosstalk. (c) 2006 American Institute of Physics.
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700 1 _ |a Rüdiger, A.
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700 1 _ |a Waser, R.
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773 _ _ |a 10.1063/1.2176081
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856 7 _ |u http://dx.doi.org/10.1063/1.2176081
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856 4 _ |u https://juser.fz-juelich.de/record/50808/files/79486.pdf
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920 1 _ |d 31.12.2006
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920 1 _ |d 14.09.2008
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