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@ARTICLE{Bleikamp:50976,
author = {Bleikamp, S. and Thoma, A. and Polop, C. and Pirug, G. and
Linke, U. and Michely, T.},
title = {{N}ew {G}rowth {M}ode through {D}ecorated {T}win
{B}oundaries},
journal = {Physical review letters},
volume = {96},
issn = {0031-9007},
address = {College Park, Md.},
publisher = {APS},
reportid = {PreJuSER-50976},
pages = {115503},
year = {2006},
note = {Record converted from VDB: 12.11.2012},
abstract = {Scanning tunneling microscopy and low energy electron
diffraction were used to investigate the growth of partly
twinned Ir thin films on Ir(111). A transition from the
expected layer-by-layer to a defect dominated growth mode
with a fixed lateral length scale and increasing roughness
is observed. During growth, the majority of the film is
stably transformed to twinned stacking. This transition is
initiated by the energetic avoidance of the formation of
intrinsic stacking faults compared to two independent twin
faults. The atomistic details of the defect kinetics are
outlined.},
keywords = {J (WoSType)},
cin = {ISG-3 / CNI},
ddc = {550},
cid = {I:(DE-Juel1)VDB43 / I:(DE-Juel1)VDB381},
pnm = {Grundlagen für zukünftige Informationstechnologien},
pid = {G:(DE-Juel1)FUEK412},
shelfmark = {Physics, Multidisciplinary},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000236249900041},
doi = {10.1103/PhysRevLett.96.115503},
url = {https://juser.fz-juelich.de/record/50976},
}