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000052209 0247_ $$2DOI$$a10.1103/PhysRevLett.96.016101
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000052209 084__ $$2WoS$$aPhysics, Multidisciplinary
000052209 1001_ $$0P:(DE-HGF)0$$aCaciuc, V.$$b0
000052209 245__ $$aAtomic-scale sharpening of silicon tips in non-contact atomic force microscopy
000052209 260__ $$aCollege Park, Md.$$bAPS$$c2006
000052209 300__ $$a016101
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000052209 440_0 $$04925$$aPhysical Review Letters$$v96$$x0031-9007
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000052209 520__ $$aThe atomic-scale stability of clean silicon tips used in noncontact atomic force microscopy (NC-AFM) is simulated by ab initio calculations based on density functional theory. The tip structures are modeled by silicon clusters with [111] and [001] termination. For the often assumed Si(111)-type tip we observe the sharpening of the initially blunt tip via short-range chemical forces during the first approach and retraction cycle. The structural changes corresponding to this intrinsic process are irreversible and lead to stable NC-AFM imaging conditions. In opposition to the picture used in literature, the Si(001)-type tip does not exhibit the so-called "two-dangling bond" feature as a bulklike termination suggests.
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000052209 7001_ $$0P:(DE-HGF)0$$aHölscher, H.$$b1
000052209 7001_ $$0P:(DE-Juel1)130548$$aBlügel, S.$$b2$$uFZJ
000052209 7001_ $$0P:(DE-HGF)0$$aFuchs, H.$$b3
000052209 773__ $$0PERI:(DE-600)1472655-5$$a10.1103/PhysRevLett.96.016101$$gVol. 96, p. 016101$$p016101$$q96<016101$$tPhysical review letters$$v96$$x0031-9007$$y2006
000052209 8567_ $$uhttp://hdl.handle.net/2128/1446$$uhttp://dx.doi.org/10.1103/PhysRevLett.96.016101
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