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@ARTICLE{Caciuc:52209,
author = {Caciuc, V. and Hölscher, H. and Blügel, S. and Fuchs, H.},
title = {{A}tomic-scale sharpening of silicon tips in non-contact
atomic force microscopy},
journal = {Physical review letters},
volume = {96},
issn = {0031-9007},
address = {College Park, Md.},
publisher = {APS},
reportid = {PreJuSER-52209},
pages = {016101},
year = {2006},
note = {Record converted from VDB: 12.11.2012},
abstract = {The atomic-scale stability of clean silicon tips used in
noncontact atomic force microscopy (NC-AFM) is simulated by
ab initio calculations based on density functional theory.
The tip structures are modeled by silicon clusters with
[111] and [001] termination. For the often assumed
Si(111)-type tip we observe the sharpening of the initially
blunt tip via short-range chemical forces during the first
approach and retraction cycle. The structural changes
corresponding to this intrinsic process are irreversible and
lead to stable NC-AFM imaging conditions. In opposition to
the picture used in literature, the Si(001)-type tip does
not exhibit the so-called "two-dangling bond" feature as a
bulklike termination suggests.},
keywords = {J (WoSType)},
cin = {IFF-TH-I / JARA-FIT / JARA-SIM},
ddc = {550},
cid = {I:(DE-Juel1)VDB30 / $I:(DE-82)080009_20140620$ /
I:(DE-Juel1)VDB1045},
pnm = {Kondensierte Materie},
pid = {G:(DE-Juel1)FUEK414},
shelfmark = {Physics, Multidisciplinary},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000234608300055},
doi = {10.1103/PhysRevLett.96.016101},
url = {https://juser.fz-juelich.de/record/52209},
}