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| 017 | _ | _ | |a This version is available at the following Publisher URL: http://jap.aip.org |
| 024 | 7 | _ | |a 10.1063/1.2364036 |2 DOI |
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| 084 | _ | _ | |2 WoS |a Physics, Applied |
| 100 | 1 | _ | |a Karthäuser, S. |b 0 |u FZJ |0 P:(DE-Juel1)130751 |
| 245 | _ | _ | |a Resistive switching of rose bengal devices: a molecular effect? |
| 260 | _ | _ | |a Melville, NY |b American Institute of Physics |c 2006 |
| 300 | _ | _ | |a 094504 |
| 336 | 7 | _ | |a Journal Article |0 PUB:(DE-HGF)16 |2 PUB:(DE-HGF) |
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| 440 | _ | 0 | |a Journal of Applied Physics |x 0021-8979 |0 3051 |v 100 |
| 500 | _ | _ | |a Record converted from VDB: 12.11.2012 |
| 520 | _ | _ | |a The resistive switching behavior of devices consisting of aluminum top electrode, molecular layer (rose bengal), and bottom electrode (zinc oxide and indium tin oxide) is examined. By measuring the current versus voltage dependence of these devices for various frequencies and by systematically varying the composition of the device, we show that the switching is an extrinsic effect that is not primarily dependent on the molecular layer. It is shown that the molecular layer is short circuited by filaments of either zinc oxide or aluminum and that the switching effect is due to a thin layer of aluminum oxide at the zinc oxide/aluminum interface. (c) 2006 American Institute of Physics. |
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| 700 | 1 | _ | |a Weides, M. |b 2 |u FZJ |0 P:(DE-Juel1)VDB59925 |
| 700 | 1 | _ | |a Alba, M. |b 3 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Besmehn, A. |b 4 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Oligschlaeger, R. |b 5 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Waser, R. |b 6 |u FZJ |0 P:(DE-Juel1)131022 |
| 773 | _ | _ | |a 10.1063/1.2364036 |g Vol. 100, p. 094504 |p 094504 |q 100<094504 |0 PERI:(DE-600)1476463-5 |t Journal of applied physics |v 100 |y 2006 |x 0021-8979 |
| 856 | 7 | _ | |u http://dx.doi.org/10.1063/1.2364036 |u http://hdl.handle.net/2128/2261 |
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