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000053332 084__ $$2WoS$$aInstruments & Instrumentation
000053332 084__ $$2WoS$$aPhysics, Applied
000053332 1001_ $$0P:(DE-Juel1)VDB64015$$aJaschinsky, P.$$b0$$uFZJ
000053332 245__ $$aDesign and performance of a beetle-type double-tip scanning tunneling microscope
000053332 260__ $$a[S.l.]$$bAmerican Institute of Physics$$c2006
000053332 300__ $$a093701
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000053332 520__ $$aA combination of a double-tip scanning tunneling microscope with a scanning electron microscope in ultrahigh vacuum environment is presented. The compact beetle-type design made it possible to integrate two independently driven scanning tunneling microscopes in a small space. Moreover, an additional level for coarse movement allows the decoupling of the translation and approach of the tunneling tip. The position of the two tips can be controlled from the millimeter scale down to 50 nm with the help of an add-on electron microscope. The instrument is capable of atomic resolution imaging with each tip. (c) 2006 American Institute of Physics.
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000053332 7001_ $$0P:(DE-Juel1)VDB5705$$aCoenen, P.$$b1$$uFZJ
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