Hauptseite > Publikationsdatenbank > Design and performance of a beetle-type double-tip scanning tunneling microscope > print

001     53332
005     20200423204357.0
017 _ _ |a This version is available at the following Publisher URL: http://rsi.aip.org
024 7 _ |a 10.1063/1.2336112
|2 DOI
024 7 _ |a WOS:000240878100019
|2 WOS
024 7 _ |a 2128/2170
|2 Handle
037 _ _ |a PreJuSER-53332
041 _ _ |a eng
082 _ _ |a 530
084 _ _ |2 WoS
|a Instruments & Instrumentation
084 _ _ |2 WoS
|a Physics, Applied
100 1 _ |a Jaschinsky, P.
|b 0
|u FZJ
|0 P:(DE-Juel1)VDB64015
245 _ _ |a Design and performance of a beetle-type double-tip scanning tunneling microscope
260 _ _ |a [S.l.]
|b American Institute of Physics
|c 2006
300 _ _ |a 093701
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|0 0
|2 EndNote
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
440 _ 0 |a Review of Scientific Instruments
|x 0034-6748
|0 5309
|v 77
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a A combination of a double-tip scanning tunneling microscope with a scanning electron microscope in ultrahigh vacuum environment is presented. The compact beetle-type design made it possible to integrate two independently driven scanning tunneling microscopes in a small space. Moreover, an additional level for coarse movement allows the decoupling of the translation and approach of the tunneling tip. The position of the two tips can be controlled from the millimeter scale down to 50 nm with the help of an add-on electron microscope. The instrument is capable of atomic resolution imaging with each tip. (c) 2006 American Institute of Physics.
536 _ _ |a Grundlagen für zukünftige Informationstechnologien
|c P42
|2 G:(DE-HGF)
|0 G:(DE-Juel1)FUEK412
|x 0
588 _ _ |a Dataset connected to Web of Science
650 _ 7 |a J
|2 WoSType
700 1 _ |a Coenen, P.
|b 1
|u FZJ
|0 P:(DE-Juel1)VDB5705
700 1 _ |a Pirug, G.
|b 2
|u FZJ
|0 P:(DE-Juel1)128784
700 1 _ |a Voigtländer, B.
|b 3
|u FZJ
|0 P:(DE-Juel1)VDB5601
773 _ _ |a 10.1063/1.2336112
|g Vol. 77, p. 093701
|p 093701
|q 77<093701
|0 PERI:(DE-600)1472905-2
|t Review of scientific instruments
|v 77
|y 2006
|x 0034-6748
856 7 _ |u http://dx.doi.org/10.1063/1.2336112
|u http://hdl.handle.net/2128/2170
856 4 _ |u https://juser.fz-juelich.de/record/53332/files/83820.pdf
|y OpenAccess
856 4 _ |u https://juser.fz-juelich.de/record/53332/files/83820.jpg?subformat=icon-1440
|x icon-1440
|y OpenAccess
856 4 _ |u https://juser.fz-juelich.de/record/53332/files/83820.jpg?subformat=icon-180
|x icon-180
|y OpenAccess
856 4 _ |u https://juser.fz-juelich.de/record/53332/files/83820.jpg?subformat=icon-640
|x icon-640
|y OpenAccess
909 C O |o oai:juser.fz-juelich.de:53332
|p openaire
|p open_access
|p driver
|p VDB
|p dnbdelivery
913 1 _ |k P42
|v Grundlagen für zukünftige Informationstechnologien
|l Grundlagen für zukünftige Informationstechnologien (FIT)
|b Schlüsseltechnologien
|0 G:(DE-Juel1)FUEK412
|x 0
914 1 _ |y 2006
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
915 _ _ |2 StatID
|0 StatID:(DE-HGF)0510
|a OpenAccess
920 1 _ |k CNI
|l Center of Nanoelectronic Systems for Information Technology
|d 14.09.2008
|g CNI
|z 381
|0 I:(DE-Juel1)VDB381
|x 1
920 1 _ |k ISG-3
|l Institut für Grenzflächen und Vakuumtechnologien
|d 31.12.2006
|g ISG
|0 I:(DE-Juel1)VDB43
|x 0
970 _ _ |a VDB:(DE-Juel1)83820
980 _ _ |a VDB
980 _ _ |a JUWEL
980 _ _ |a ConvertedRecord
980 _ _ |a journal
980 _ _ |a I:(DE-Juel1)VDB381
980 _ _ |a I:(DE-Juel1)PGI-3-20110106
980 _ _ |a UNRESTRICTED
980 _ _ |a FullTexts
980 1 _ |a FullTexts
981 _ _ |a I:(DE-Juel1)PGI-3-20110106

LibraryCollectionCLSMajorCLSMinorLanguageAuthor
Marc 21