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Surface phenomena induced by metal deposition on layered chalcogenides
Jäger, W. ; Hollensteiner, S. ; Spiecker, E. ; Dietz, F. ; Kipp, L. ; Schroeder, H.FZJ* ; Gnaser, H. ; Sigle, W.
2005
2005International Conference on Electron Microscopy of Solids - EMS 2005
Seminar, Kasimierz Dolny, PolandKasimierz Dolny, Poland, 5 Jun 20052005-06-05
Note: Record converted from VDB: 12.11.2012
Contributing Institute(s):
- Elektronische Materialien (IFF-IEM)
- Center of Nanoelectronic Systems for Information Technology (CNI)
Research Program(s):
- Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik (I01)
Appears in the scientific report
2005
Notes: Nachtrag