000053748 001__ 53748
000053748 005__ 20240610121237.0
000053748 017__ $$aThis version is available at the following Publisher URL: http://prl.aps.org
000053748 0247_ $$2DOI$$a10.1103/PhysRevLett.95.125502
000053748 0247_ $$2WOS$$aWOS:000231908200031
000053748 0247_ $$2Handle$$a2128/1104
000053748 037__ $$aPreJuSER-53748
000053748 041__ $$aeng
000053748 082__ $$a550
000053748 084__ $$2WoS$$aPhysics, Multidisciplinary
000053748 1001_ $$0P:(DE-HGF)0$$aStaab, T. E. M.$$b0
000053748 245__ $$aAgglomeration of As antisites in As-rich low-temperature GaAs: Nucleation without a critical nucleus size
000053748 260__ $$aCollege Park, Md.$$bAPS$$c2005
000053748 300__ $$a125502
000053748 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article
000053748 3367_ $$2DataCite$$aOutput Types/Journal article
000053748 3367_ $$00$$2EndNote$$aJournal Article
000053748 3367_ $$2BibTeX$$aARTICLE
000053748 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000053748 3367_ $$2DRIVER$$aarticle
000053748 440_0 $$04925$$aPhysical Review Letters$$v95$$x0031-9007
000053748 500__ $$aRecord converted from VDB: 12.11.2012
000053748 520__ $$aTo investigate the early stages of nucleation and growth of As precipitates in GaAs grown at low substrate temperature, we make use of a self-consistent-charge density-functional based tight-binding method. Since a pair of As antisites already shows a significant binding energy which increases when more As antisites are attached, there is no critical nucleus size. Provided that all excess As has precipitated, the clusters may grow in size since the binding energies increase with increasing agglomeration size. These findings close the gap between experimental investigation of point defects and the detection of nanometer-size precipitates in transmission electron microscopy.
000053748 536__ $$0G:(DE-Juel1)FUEK252$$2G:(DE-HGF)$$aMaterialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik$$cI01$$x0
000053748 588__ $$aDataset connected to Web of Science
000053748 650_7 $$2WoSType$$aJ
000053748 7001_ $$0P:(DE-HGF)0$$aNieminen, R. M.$$b1
000053748 7001_ $$0P:(DE-Juel1)130811$$aLuysberg, M.$$b2$$uFZJ
000053748 7001_ $$0P:(DE-HGF)0$$aFrauenheim, Th.$$b3
000053748 773__ $$0PERI:(DE-600)1472655-5$$a10.1103/PhysRevLett.95.125502$$gVol. 95, p. 125502$$p125502$$q95<125502$$tPhysical review letters$$v95$$x0031-9007$$y2005
000053748 8567_ $$uhttp://hdl.handle.net/2128/1104$$uhttp://dx.doi.org/10.1103/PhysRevLett.95.125502
000053748 8564_ $$uhttps://juser.fz-juelich.de/record/53748/files/84373.pdf$$yOpenAccess
000053748 8564_ $$uhttps://juser.fz-juelich.de/record/53748/files/84373.jpg?subformat=icon-1440$$xicon-1440$$yOpenAccess
000053748 8564_ $$uhttps://juser.fz-juelich.de/record/53748/files/84373.jpg?subformat=icon-180$$xicon-180$$yOpenAccess
000053748 8564_ $$uhttps://juser.fz-juelich.de/record/53748/files/84373.jpg?subformat=icon-640$$xicon-640$$yOpenAccess
000053748 909CO $$ooai:juser.fz-juelich.de:53748$$pdnbdelivery$$pVDB$$pdriver$$popen_access$$popenaire
000053748 9131_ $$0G:(DE-Juel1)FUEK252$$bInformation$$kI01$$lInformationstechnologie mit nanoelektronischen Systemen$$vMaterialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik$$x0
000053748 9141_ $$aNachtrag$$y2005
000053748 915__ $$0StatID:(DE-HGF)0010$$aJCR/ISI refereed
000053748 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000053748 9201_ $$0I:(DE-Juel1)VDB37$$d31.12.2006$$gIFF$$kIFF-IMF$$lMikrostrukturforschung$$x0
000053748 970__ $$aVDB:(DE-Juel1)84373
000053748 9801_ $$aFullTexts
000053748 980__ $$aVDB
000053748 980__ $$aJUWEL
000053748 980__ $$aConvertedRecord
000053748 980__ $$ajournal
000053748 980__ $$aI:(DE-Juel1)PGI-5-20110106
000053748 980__ $$aUNRESTRICTED
000053748 980__ $$aFullTexts
000053748 981__ $$aI:(DE-Juel1)ER-C-1-20170209
000053748 981__ $$aI:(DE-Juel1)PGI-5-20110106