Home > Publications database > Agglomeration of As antisites in As-rich low-temperature GaAs: Nucleation without a critical nucleus size > print |
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017 | _ | _ | |a This version is available at the following Publisher URL: http://prl.aps.org |
024 | 7 | _ | |a 10.1103/PhysRevLett.95.125502 |2 DOI |
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024 | 7 | _ | |a 2128/1104 |2 Handle |
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084 | _ | _ | |2 WoS |a Physics, Multidisciplinary |
100 | 1 | _ | |a Staab, T. E. M. |b 0 |0 P:(DE-HGF)0 |
245 | _ | _ | |a Agglomeration of As antisites in As-rich low-temperature GaAs: Nucleation without a critical nucleus size |
260 | _ | _ | |a College Park, Md. |b APS |c 2005 |
300 | _ | _ | |a 125502 |
336 | 7 | _ | |a Journal Article |0 PUB:(DE-HGF)16 |2 PUB:(DE-HGF) |
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440 | _ | 0 | |a Physical Review Letters |x 0031-9007 |0 4925 |v 95 |
500 | _ | _ | |a Record converted from VDB: 12.11.2012 |
520 | _ | _ | |a To investigate the early stages of nucleation and growth of As precipitates in GaAs grown at low substrate temperature, we make use of a self-consistent-charge density-functional based tight-binding method. Since a pair of As antisites already shows a significant binding energy which increases when more As antisites are attached, there is no critical nucleus size. Provided that all excess As has precipitated, the clusters may grow in size since the binding energies increase with increasing agglomeration size. These findings close the gap between experimental investigation of point defects and the detection of nanometer-size precipitates in transmission electron microscopy. |
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588 | _ | _ | |a Dataset connected to Web of Science |
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700 | 1 | _ | |a Nieminen, R. M. |b 1 |0 P:(DE-HGF)0 |
700 | 1 | _ | |a Luysberg, M. |b 2 |u FZJ |0 P:(DE-Juel1)130811 |
700 | 1 | _ | |a Frauenheim, Th. |b 3 |0 P:(DE-HGF)0 |
773 | _ | _ | |a 10.1103/PhysRevLett.95.125502 |g Vol. 95, p. 125502 |p 125502 |q 95<125502 |0 PERI:(DE-600)1472655-5 |t Physical review letters |v 95 |y 2005 |x 0031-9007 |
856 | 7 | _ | |u http://dx.doi.org/10.1103/PhysRevLett.95.125502 |u http://hdl.handle.net/2128/1104 |
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913 | 1 | _ | |k I01 |v Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |l Informationstechnologie mit nanoelektronischen Systemen |b Information |0 G:(DE-Juel1)FUEK252 |x 0 |
914 | 1 | _ | |a Nachtrag |y 2005 |
915 | _ | _ | |0 StatID:(DE-HGF)0010 |a JCR/ISI refereed |
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