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@ARTICLE{Setter:56191,
      author       = {Setter, N. and Damjanovic, D. and Eng, L. and Fox, G. and
                      Gevorgian, S. and Hong, S. and Kingon, A. and Kohlstedt, H.
                      and Park, N. Y. and Stephenson, G. B. and Stolichnov, I. and
                      Tagantsev, A. K. and Taylor, D. V. and Yamada, Y. and
                      Streiffer, S.},
      title        = {{F}erroelectric thin films: {R}eview of materials,
                      properties and applications},
      journal      = {Journal of applied physics},
      volume       = {100},
      issn         = {0021-8979},
      address      = {Melville, NY},
      publisher    = {American Institute of Physics},
      reportid     = {PreJuSER-56191},
      pages        = {051606},
      year         = {2006},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {An overview of the state of art in ferroelectric thin films
                      is presented. First, we review applications: microsystems'
                      applications, applications in high frequency electronics,
                      and memories based on ferroelectric materials. The second
                      section deals with materials, structure (domains, in
                      particular), and size effects. Properties of thin films that
                      are important for applications are then addressed:
                      polarization reversal and properties related to the
                      reliability of ferroelectric memories, piezoelectric
                      nonlinearity of ferroelectric films which is relevant to
                      microsystems' applications, and permittivity and loss in
                      ferroelectric films-important in all applications and
                      essential in high frequency devices. In the context of
                      properties we also discuss nanoscale probing of
                      ferroelectrics. Finally, we comment on two important
                      emerging topics: multiferroic materials and ferroelectric
                      one-dimensional nanostructures. (c) 2006 American Institute
                      of Physics.},
      keywords     = {J (WoSType)},
      cin          = {IFF-IEM / CNI},
      ddc          = {530},
      cid          = {I:(DE-Juel1)VDB321 / I:(DE-Juel1)VDB381},
      pnm          = {Grundlagen für zukünftige Informationstechnologien},
      pid          = {G:(DE-Juel1)FUEK412},
      shelfmark    = {Physics, Applied},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000240602500007},
      doi          = {10.1063/1.2336999},
      url          = {https://juser.fz-juelich.de/record/56191},
}