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@ARTICLE{Kukhar:56194,
      author       = {Kukhar, V. G. and Pertsev, N. and Kohlstedt, H. and Waser,
                      R.},
      title        = {{P}olarization states of polydomain epitaxial
                      ${P}b({Z}r_1-x{T}i_x){O}_3$ thin films and their dielectric
                      properties},
      journal      = {Physical review / B},
      volume       = {73},
      number       = {21},
      issn         = {1098-0121},
      address      = {College Park, Md.},
      publisher    = {APS},
      reportid     = {PreJuSER-56194},
      pages        = {214103},
      year         = {2006},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {Ferroelectric and dielectric properties of polydomain
                      (twinned) single-crystalline Pb(Zr1-xTix)O-3 thin films are
                      described with the aid of a nonlinear thermodynamic theory,
                      which has been developed recently for epitaxial
                      ferroelectric films with dense laminar domain structures.
                      For Pb(Zr1-xTix)O-3 (PZT) films with compositions x=0.9,
                      0.8, 0.7, 0.6, 0.5, and 0.4, the "misfit strain-temperature"
                      phase diagrams are calculated and compared with each other.
                      It is found that the equilibrium diagrams of PZT films with
                      x >= 0.7 are similar to the diagram of PbTiO3 films. They
                      consist of only four different stability ranges, which
                      correspond to the paraelectric phase, single-domain
                      tetragonal ferroelectric phase, and two pseudotetragonal
                      domain patterns. In contrast, at x=0.4, 0.5, and 0.6, the
                      equilibrium diagram displays a rich variety of stable
                      polarization states, involving at least one monoclinic
                      polydomain state. Using the developed phase diagrams, the
                      mean out-of-plane polarization of a poled PZT film is
                      calculated as a function of the misfit strain and
                      composition. Theoretical results are compared with the
                      measured remanent polarizations of PZT films grown on
                      SrTiO3. Dependence of the out-of-plane dielectric response
                      of PZT films on the misfit strain in the heterostructure is
                      also reported.},
      keywords     = {J (WoSType)},
      cin          = {IFF-IEM / CNI / JARA-FIT},
      ddc          = {530},
      cid          = {I:(DE-Juel1)VDB321 / I:(DE-Juel1)VDB381 /
                      $I:(DE-82)080009_20140620$},
      pnm          = {Grundlagen für zukünftige Informationstechnologien},
      pid          = {G:(DE-Juel1)FUEK412},
      shelfmark    = {Physics, Condensed Matter},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000238696200035},
      doi          = {10.1103/PhysRevB.73.214103},
      url          = {https://juser.fz-juelich.de/record/56194},
}