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@ARTICLE{Halder:56913,
      author       = {Halder, S. and Schneller, T. and Waser, R.},
      title        = {{M}icrostructure and electrical properties of {B}a{T}i{O}3
                      and ({B}a,{S}r){T}i{O}3 ferroelectric thin films on nickel
                      electrodes},
      journal      = {Journal of sol gel science and technology},
      volume       = {42},
      issn         = {0928-0707},
      address      = {Dordrecht [u.a.]},
      publisher    = {Springer Science + Business Media B.V},
      reportid     = {PreJuSER-56913},
      pages        = {203},
      year         = {2007},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {Nickel thin films have been sputtered on standard Si/SiO2
                      substrates with TiO2 as an adhesive layer. The thermal
                      stability of these substrates was analyzed. SEM images show
                      an increase in grain size with annealing temperature. They
                      were found to be stable till 800 degrees C, beyond which the
                      nickel layer disintegrated. These substrates were used for
                      deposition of BaTiO3 and (Ba,Sr)TiO3 dielectric thin films
                      under a reducing atmosphere. The dielectric thin films were
                      processed with various pyrolysis and annealing temperatures
                      in order to optimize the dielectric properties. Increased
                      pyrolysis temperatures showed an increase in the grain size.
                      Results on these nickelised substrates were finally compared
                      with dielectric films deposited on platinized silicon
                      substrates under identical conditions but crystallized in an
                      oxygen atmosphere.},
      keywords     = {J (WoSType)},
      cin          = {IFF-6 / CNI / JARA-FIT},
      ddc          = {600},
      cid          = {I:(DE-Juel1)VDB786 / I:(DE-Juel1)VDB381 /
                      $I:(DE-82)080009_20140620$},
      pnm          = {Grundlagen für zukünftige Informationstechnologien /
                      Kondensierte Materie},
      pid          = {G:(DE-Juel1)FUEK412 / G:(DE-Juel1)FUEK414},
      shelfmark    = {Materials Science, Ceramics},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000245899500002},
      doi          = {10.1007/s10971-007-0763-3},
      url          = {https://juser.fz-juelich.de/record/56913},
}