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@ARTICLE{Bozbey:57029,
author = {Bozbey, A. and Fardmanesh, M. and Schubert, J. and Banzet,
M.},
title = {{S}ubstrate and device pattern dependence of the thermal
crosstalk in {YB}a2{C}u3{O}7-delta transition edge bolometer
arrays},
journal = {IEEE transactions on applied superconductivity},
volume = {16},
number = {4},
issn = {1051-8223},
address = {New York, NY},
publisher = {IEEE},
reportid = {PreJuSER-57029},
pages = {1953 - 1958},
year = {2006},
note = {Record converted from VDB: 12.11.2012},
abstract = {Using YBa2CU3O7-delta (YBCO) thin films, pulsed laser
deposited on 1-mm-thick LaAlO3 or SrTiO3 substrates, we made
4 x 1 pixel arrays of transition edge bolometers with
separations between neighboring pixels ranging from 40 mu m
to 170 mu m for testing purposes. We investigated the
effects of the YBCO film thickness (200 and 400 nm),
substrate material, and back-etching of the substrate, on
the crosstalk between the pixels of the arrays. The
investigation was based on the analysis of the voltage
response of the de current biased bolometers versus the
modulation frequency of a near-infrared laser source. We
observed that the bolometer arrays made of 400-nm-thick
films had less interpixel thermal crosstalk than the
200-nm-thick films. The effect of substrate thickness on the
response of the pixels was investigated by up to 500 mu m
back-etching of the substrates. The bolometers made on
back-etched LaAlO3 substrates had anomalous crosstalk
response behavior, which was effective at higher modulation
frequencies. In addition, we present an analytical thermal
model for explaining the observed effects of the thermal
crosstalk on the response characteristics of the pixels of
the arrays. We report the measured response and the
anticipated thermal crosstalk of the characterized
bolometers'. We describe the responses based on the thermal
models and discrepancies from the model's predictions.},
keywords = {J (WoSType)},
cin = {ISG-2 / ISG-1 / CNI},
ddc = {530},
cid = {I:(DE-Juel1)VDB42 / I:(DE-Juel1)VDB41 / I:(DE-Juel1)VDB381},
pnm = {Grundlagen für zukünftige Informationstechnologien},
pid = {G:(DE-Juel1)FUEK412},
shelfmark = {Engineering, Electrical $\&$ Electronic / Physics, Applied},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000242949500001},
doi = {10.1109/TASC.2006.881820},
url = {https://juser.fz-juelich.de/record/57029},
}