%0 Journal Article
%A Schroer, C.G.
%A Boyer, P.
%A Feldkamp, J.
%A Patommel, J.
%A Schropp, A.
%A Samberg, D.
%A Stephan, S.
%A Burghammer, M.
%A Schröder, S.
%A Riekel, C.
%A Lengeler, B.
%A Falkenberg, G.
%A Wellenreuther, G.
%A Kuhlmann, M.
%A Frahm, R.
%A Lützenkirchen-Hecht, D.
%A Schröder, W. H.
%T Hard X-Ray Microscopy with Elemental, Chemical, and Structural Contrast
%J Acta physica Polonica / A
%V 117
%@ 0587-4246
%C Warsaw
%I Acad. Inst.
%M PreJuSER-5727
%P 357 - 368
%D 2010
%Z Record converted from VDB: 12.11.2012
%< ACTA PHYSICA POLONICA A 2010 (2), Vol. 117, 357
%X We review hard X-ray microscopy techniques with a focus on scanning microscopy with synchrotron radiation. Its strength compared to other microscopies is the large penetration depth of hard x rays in matter that allows one to investigate the interior of an object without destructive sample preparation. In combination with tomography, local information from inside of a specimen can be obtained, even from inside special non-ambient sample environments. Different X-ray analytical techniques can be used to produce contrast, such as X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample, respectively. This makes X-ray microscopy attractive to many fields of science, ranging from physics and chemistry to materials, geo-, and environmental science, biomedicine, and nanotechnology. Our scanning microscope based on nanofocusing refractive X-ray lenses has a routine spatial resolution of about 100 nm and supports the contrast mechanisms mentioned above. In combination with coherent X-ray diffraction imaging, the spatial resolution can be improved to the 10 nm range. The current state-of-the-art of this technique is illustrated by several examples, and future prospects of the technique are given.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000277950400022
%U https://juser.fz-juelich.de/record/5727