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000005727 1001_ $$0P:(DE-HGF)0$$aSchroer, C.G.$$b0
000005727 245__ $$aHard X-Ray Microscopy with Elemental, Chemical, and Structural Contrast
000005727 260__ $$aWarsaw$$bAcad. Inst.$$c2010
000005727 29510 $$aACTA PHYSICA POLONICA A 2010 (2), Vol. 117, 357
000005727 300__ $$a357 - 368
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000005727 520__ $$aWe review hard X-ray microscopy techniques with a focus on scanning microscopy with synchrotron radiation. Its strength compared to other microscopies is the large penetration depth of hard x rays in matter that allows one to investigate the interior of an object without destructive sample preparation. In combination with tomography, local information from inside of a specimen can be obtained, even from inside special non-ambient sample environments. Different X-ray analytical techniques can be used to produce contrast, such as X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample, respectively. This makes X-ray microscopy attractive to many fields of science, ranging from physics and chemistry to materials, geo-, and environmental science, biomedicine, and nanotechnology. Our scanning microscope based on nanofocusing refractive X-ray lenses has a routine spatial resolution of about 100 nm and supports the contrast mechanisms mentioned above. In combination with coherent X-ray diffraction imaging, the spatial resolution can be improved to the 10 nm range. The current state-of-the-art of this technique is illustrated by several examples, and future prospects of the technique are given.
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000005727 7001_ $$0P:(DE-HGF)0$$aBoyer, P.$$b1
000005727 7001_ $$0P:(DE-HGF)0$$aFeldkamp, J.$$b2
000005727 7001_ $$0P:(DE-HGF)0$$aPatommel, J.$$b3
000005727 7001_ $$0P:(DE-HGF)0$$aSchropp, A.$$b4
000005727 7001_ $$0P:(DE-HGF)0$$aSamberg, D.$$b5
000005727 7001_ $$0P:(DE-HGF)0$$aStephan, S.$$b6
000005727 7001_ $$0P:(DE-HGF)0$$aBurghammer, M.$$b7
000005727 7001_ $$0P:(DE-HGF)0$$aSchröder, S.$$b8
000005727 7001_ $$0P:(DE-HGF)0$$aRiekel, C.$$b9
000005727 7001_ $$0P:(DE-HGF)0$$aLengeler, B.$$b10
000005727 7001_ $$0P:(DE-HGF)0$$aFalkenberg, G.$$b11
000005727 7001_ $$0P:(DE-HGF)0$$aWellenreuther, G.$$b12
000005727 7001_ $$0P:(DE-HGF)0$$aKuhlmann, M.$$b13
000005727 7001_ $$0P:(DE-HGF)0$$aFrahm, R.$$b14
000005727 7001_ $$0P:(DE-HGF)0$$aLützenkirchen-Hecht, D.$$b15
000005727 7001_ $$0P:(DE-Juel1)VDB1472$$aSchröder, W. H.$$b16$$uFZJ
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