TY  - JOUR
AU  - Schroer, C.G.
AU  - Boyer, P.
AU  - Feldkamp, J.
AU  - Patommel, J.
AU  - Schropp, A.
AU  - Samberg, D.
AU  - Stephan, S.
AU  - Burghammer, M.
AU  - Schröder, S.
AU  - Riekel, C.
AU  - Lengeler, B.
AU  - Falkenberg, G.
AU  - Wellenreuther, G.
AU  - Kuhlmann, M.
AU  - Frahm, R.
AU  - Lützenkirchen-Hecht, D.
AU  - Schröder, W. H.
TI  - Hard X-Ray Microscopy with Elemental, Chemical, and Structural Contrast
JO  - Acta physica Polonica / A
VL  - 117
SN  - 0587-4246
CY  - Warsaw
PB  - Acad. Inst.
M1  - PreJuSER-5727
SP  - 357 - 368
PY  - 2010
N1  - Record converted from VDB: 12.11.2012
AB  - We review hard X-ray microscopy techniques with a focus on scanning microscopy with synchrotron radiation. Its strength compared to other microscopies is the large penetration depth of hard x rays in matter that allows one to investigate the interior of an object without destructive sample preparation. In combination with tomography, local information from inside of a specimen can be obtained, even from inside special non-ambient sample environments. Different X-ray analytical techniques can be used to produce contrast, such as X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample, respectively. This makes X-ray microscopy attractive to many fields of science, ranging from physics and chemistry to materials, geo-, and environmental science, biomedicine, and nanotechnology. Our scanning microscope based on nanofocusing refractive X-ray lenses has a routine spatial resolution of about 100 nm and supports the contrast mechanisms mentioned above. In combination with coherent X-ray diffraction imaging, the spatial resolution can be improved to the 10 nm range. The current state-of-the-art of this technique is illustrated by several examples, and future prospects of the technique are given.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000277950400022
UR  - https://juser.fz-juelich.de/record/5727
ER  -