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@ARTICLE{Schroer:5727,
      author       = {Schroer, C.G. and Boyer, P. and Feldkamp, J. and Patommel,
                      J. and Schropp, A. and Samberg, D. and Stephan, S. and
                      Burghammer, M. and Schröder, S. and Riekel, C. and
                      Lengeler, B. and Falkenberg, G. and Wellenreuther, G. and
                      Kuhlmann, M. and Frahm, R. and Lützenkirchen-Hecht, D. and
                      Schröder, W. H.},
      title        = {{H}ard {X}-{R}ay {M}icroscopy with {E}lemental, {C}hemical,
                      and {S}tructural {C}ontrast},
      journal      = {Acta physica Polonica / A},
      volume       = {117},
      issn         = {0587-4246},
      address      = {Warsaw},
      publisher    = {Acad. Inst.},
      reportid     = {PreJuSER-5727},
      pages        = {357 - 368},
      year         = {2010},
      note         = {Record converted from VDB: 12.11.2012},
      comment      = {ACTA PHYSICA POLONICA A 2010 (2), Vol. 117, 357},
      booktitle     = {ACTA PHYSICA POLONICA A 2010 (2), Vol.
                       117, 357},
      abstract     = {We review hard X-ray microscopy techniques with a focus on
                      scanning microscopy with synchrotron radiation. Its strength
                      compared to other microscopies is the large penetration
                      depth of hard x rays in matter that allows one to
                      investigate the interior of an object without destructive
                      sample preparation. In combination with tomography, local
                      information from inside of a specimen can be obtained, even
                      from inside special non-ambient sample environments.
                      Different X-ray analytical techniques can be used to produce
                      contrast, such as X-ray absorption, fluorescence, and
                      diffraction, to yield chemical, elemental, and structural
                      information about the sample, respectively. This makes X-ray
                      microscopy attractive to many fields of science, ranging
                      from physics and chemistry to materials, geo-, and
                      environmental science, biomedicine, and nanotechnology. Our
                      scanning microscope based on nanofocusing refractive X-ray
                      lenses has a routine spatial resolution of about 100 nm and
                      supports the contrast mechanisms mentioned above. In
                      combination with coherent X-ray diffraction imaging, the
                      spatial resolution can be improved to the 10 nm range. The
                      current state-of-the-art of this technique is illustrated by
                      several examples, and future prospects of the technique are
                      given.},
      cin          = {ICG-3},
      ddc          = {500},
      cid          = {I:(DE-Juel1)ICG-3-20090406},
      pnm          = {Terrestrische Umwelt},
      pid          = {G:(DE-Juel1)FUEK407},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000277950400022},
      url          = {https://juser.fz-juelich.de/record/5727},
}