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| 001 | 5727 | ||
| 005 | 20200423202542.0 | ||
| 024 | 7 | _ | |a 0587-4246 |2 ISSN |
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| 100 | 1 | _ | |a Schroer, C.G. |b 0 |0 P:(DE-HGF)0 |
| 245 | _ | _ | |a Hard X-Ray Microscopy with Elemental, Chemical, and Structural Contrast |
| 260 | _ | _ | |a Warsaw |b Acad. Inst. |c 2010 |
| 295 | 1 | 0 | |a ACTA PHYSICA POLONICA A 2010 (2), Vol. 117, 357 |
| 300 | _ | _ | |a 357 - 368 |
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| 440 | _ | 0 | |a Acta Physica Polonica A |x 0587-4246 |0 8644 |v 117 |
| 500 | _ | _ | |a Record converted from VDB: 12.11.2012 |
| 500 | _ | _ | |a Record converted from JUWEL: 18.07.2013 |
| 520 | _ | _ | |a We review hard X-ray microscopy techniques with a focus on scanning microscopy with synchrotron radiation. Its strength compared to other microscopies is the large penetration depth of hard x rays in matter that allows one to investigate the interior of an object without destructive sample preparation. In combination with tomography, local information from inside of a specimen can be obtained, even from inside special non-ambient sample environments. Different X-ray analytical techniques can be used to produce contrast, such as X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample, respectively. This makes X-ray microscopy attractive to many fields of science, ranging from physics and chemistry to materials, geo-, and environmental science, biomedicine, and nanotechnology. Our scanning microscope based on nanofocusing refractive X-ray lenses has a routine spatial resolution of about 100 nm and supports the contrast mechanisms mentioned above. In combination with coherent X-ray diffraction imaging, the spatial resolution can be improved to the 10 nm range. The current state-of-the-art of this technique is illustrated by several examples, and future prospects of the technique are given. |
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| 700 | 1 | _ | |a Boyer, P. |b 1 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Feldkamp, J. |b 2 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Patommel, J. |b 3 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Schropp, A. |b 4 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Samberg, D. |b 5 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Stephan, S. |b 6 |0 P:(DE-HGF)0 |
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| 700 | 1 | _ | |a Falkenberg, G. |b 11 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Wellenreuther, G. |b 12 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Kuhlmann, M. |b 13 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Frahm, R. |b 14 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Lützenkirchen-Hecht, D. |b 15 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Schröder, W. H. |b 16 |u FZJ |0 P:(DE-Juel1)VDB1472 |
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