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024 7 _ |2 DOI
|a 10.1524/zksu.2006.suppl_23.363
024 7 _ |2 WOS
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037 _ _ |a PreJuSER-57453
041 _ _ |a eng
082 _ _ |a 540
084 _ _ |2 WoS
|a Crystallography
100 1 _ |a Strunz, P.
|b 0
|0 P:(DE-HGF)0
245 _ _ |a SANS investigation of precipitate microstructure in nickel-base superalloys Waspaloy and DT750
260 _ _ |a München
|b Oldenbourg
|c 2006
300 _ _ |a 363 - 368
336 7 _ |a Journal Article
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336 7 _ |a ARTICLE
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336 7 _ |a JOURNAL_ARTICLE
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336 7 _ |a article
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440 _ 0 |a Zeitschrift für Kristallographie
|x 0044-2968
|0 6017
|y Suppl. 23
|v
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a Microstructure of Waspaloy and DT750 Ni-base superalloys was investigated after the heat treatment as well as after long thermal exposure by Small-Angle Neutron Scattering (SANS). The SANS results clearly showed that there are large differences even between samples of the DT750 superalloy produced using different facilities. The modified heat treatment used for DT750 suppressed the formation of secondary precipitates. A strong influence of the thermal exposure on the superalloy microstructure was observed which can have an impact on the mechanical properties.
536 _ _ |a Rationelle Energieumwandlung
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588 _ _ |a Dataset connected to Web of Science
650 _ 7 |a J
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653 2 0 |2 Author
|a superalloys
653 2 0 |2 Author
|a precipitation
653 2 0 |2 Author
|a small-angle neutron scattering
700 1 _ |a Zrnik, J.
|b 1
|0 P:(DE-HGF)0
700 1 _ |a Seliga, T.
|b 2
|u FZJ
|0 P:(DE-Juel1)VDB41361
700 1 _ |a Penkalla, H.-J.
|b 3
|u FZJ
|0 P:(DE-Juel1)VDB85249
773 _ _ |a 10.1524/zksu.2006.suppl_23.363
|g p. 363 - 368
|p 363 - 368
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|0 PERI:(DE-600)2546071-7
|t Zeitschrift für Kristallographie / Crystalline materials
|y 2006
|x 0044-2968
856 7 _ |u http://dx.doi.org/10.1524/zksu.2006.suppl_23.363
909 C O |o oai:juser.fz-juelich.de:57453
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|l Rationelle Energieumwandlung
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914 1 _ |a Nachtrag
|y 2006
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
920 1 _ |k IWV-2
|l Werkstoffstruktur und Eigenschaften
|d 31.12.2006
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|0 I:(DE-Juel1)VDB2
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981 _ _ |a I:(DE-Juel1)IEK-2-20101013


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