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@ARTICLE{Podgursky:57558,
author = {Podgursky, V. and Adam, R. and Teske, M. and Krämer, M.
and Franchy, R.},
title = {{C}ontact-mode scanning tunneling microscopy experimental
technique employed for tunneling magnetoresistance
measurements},
journal = {Review of scientific instruments},
volume = {77},
issn = {0034-6748},
address = {[S.l.]},
publisher = {American Institute of Physics},
reportid = {PreJuSER-57558},
pages = {033906},
year = {2006},
note = {Record converted from VDB: 12.11.2012},
abstract = {We employed contact-mode scanning tunneling microscopy
technique to perform systematic measurements of
micrometer-sized Co/Al2O3/Co magnetic tunnel junctions
(MTJs). Magnetic multilayer was grown by means of magnetron
sputtering, followed by patterning of MTJ on top of FeMn
antiferromagnetic bias layer into an array of rectangular
mesa structures by standard photolithography. The maximum of
$12.5\%$ tunneling magnetoresistance at room temperature was
measured for up to 40x40 mu m(2) test MTJs. (c) 2006
American Institute of Physics.},
keywords = {J (WoSType)},
cin = {ISG-3 / CNI},
ddc = {530},
cid = {I:(DE-Juel1)VDB43 / I:(DE-Juel1)VDB381},
pnm = {Grundlagen für zukünftige Informationstechnologien},
pid = {G:(DE-Juel1)FUEK412},
shelfmark = {Instruments $\&$ Instrumentation / Physics, Applied},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000236739100028},
doi = {10.1063/1.2185152},
url = {https://juser.fz-juelich.de/record/57558},
}