001     57655
005     20240708133624.0
024 7 _ |2 DOI
|a 10.1016/j.tsf.2005.07.313
024 7 _ |2 WOS
|a WOS:000236309200057
024 7 _ |a altmetric:21817430
|2 altmetric
037 _ _ |a PreJuSER-57655
041 _ _ |a eng
082 _ _ |a 070
084 _ _ |2 WoS
|a Materials Science, Multidisciplinary
084 _ _ |2 WoS
|a Materials Science, Coatings & Films
084 _ _ |2 WoS
|a Physics, Applied
084 _ _ |2 WoS
|a Physics, Condensed Matter
100 1 _ |a Kluth, O.
|b 0
|u FZJ
|0 P:(DE-Juel1)VDB5913
245 _ _ |a Comparative material study on RF and DC magnetron sputtered ZnO:Al films
260 _ _ |a Amsterdam [u.a.]
|b Elsevier
|c 2006
300 _ _ |a
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|0 0
|2 EndNote
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
440 _ 0 |a Thin Solid Films
|x 0040-6090
|0 5762
|y 1
|v 502
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a ZnO:Al films were prepared on glass substrates by RF and DC sputtering from ceramic ZnO:Al2O3 targets. The film properties of RF sputtered ZnO:Al showed a weak dependence on film thickness and substrate temperature while a strong dependence on sputter pressure and oxygen addition to the process gas was observed. For DC sputtering in static mode at 270 degrees C a low resistivity of 2.3-5 x 10(-4) Omega cm was obtained in a wide pressure range of 0.04 to 4 Pa. At lower substrate temperatures the supply of small amounts of oxygen was required to maintain high transparency and achieve significant roughness for light scattering after wet chemical etching. Highest damp heat stability was found for ZnO:Al films deposited at low sputter pressures. This behavior could be correlated to the highly compact film structure of these films. ZnO:Al films deposited in dynamic DC mode exhibited inferior resistivity of 8-40 x 10(-4) Omega cm, which partly could be attributed to the specific design of the inline sputter system. (c) 2005 Elsevier B.V. All rights reserved.
536 _ _ |a Erneuerbare Energien
|c P11
|2 G:(DE-HGF)
|0 G:(DE-Juel1)FUEK401
|x 0
588 _ _ |a Dataset connected to Web of Science
650 _ 7 |a J
|2 WoSType
653 2 0 |2 Author
|a zinc oxide
653 2 0 |2 Author
|a thin-film solar cells
653 2 0 |2 Author
|a sputtering
653 2 0 |2 Author
|a surface morphology
700 1 _ |a Schöpe, G.
|b 1
|u FZJ
|0 P:(DE-Juel1)VDB5938
700 1 _ |a Rech, B.
|b 2
|u FZJ
|0 P:(DE-Juel1)VDB5941
700 1 _ |a Menner, R.
|b 3
|0 P:(DE-HGF)0
700 1 _ |a Oertel, M.
|b 4
|0 P:(DE-HGF)0
700 1 _ |a Orgassa, K.
|b 5
|0 P:(DE-HGF)0
700 1 _ |a Schock, H. W.
|b 6
|0 P:(DE-HGF)0
773 _ _ |a 10.1016/j.tsf.2005.07.313
|g Vol. 502
|q 502
|0 PERI:(DE-600)1482896-0
|t Thin solid films
|v 502
|y 2006
|x 0040-6090
856 7 _ |u http://dx.doi.org/10.1016/j.tsf.2005.07.313
909 C O |o oai:juser.fz-juelich.de:57655
|p VDB
913 1 _ |k P11
|v Erneuerbare Energien
|l Erneuerbare Energien
|b Energie
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|x 0
914 1 _ |a Nachtrag
|y 2006
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
920 1 _ |k IPV
|l Institut für Photovoltaik
|d 31.12.2006
|g IPV
|0 I:(DE-Juel1)VDB46
|x 1
970 _ _ |a VDB:(DE-Juel1)90687
980 _ _ |a VDB
980 _ _ |a ConvertedRecord
980 _ _ |a journal
980 _ _ |a I:(DE-Juel1)IEK-5-20101013
980 _ _ |a UNRESTRICTED
981 _ _ |a I:(DE-Juel1)IMD-3-20101013
981 _ _ |a I:(DE-Juel1)IEK-5-20101013


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