TY  - JOUR
AU  - Psiuk, B.
AU  - Szade, J.
AU  - Schroeder, H.
AU  - Haselier, H.
AU  - Mlynarczyk, M.
AU  - Waser, R.
AU  - Szot, K.
TI  - Photoemission study of SrTiO3 surface layers instability upon metal deposition
JO  - Applied physics / A
VL  - 89
SN  - 0947-8396
CY  - Berlin
PB  - Springer
M1  - PreJuSER-57726
SP  - 451 - 455
PY  - 2007
N1  - Record converted from VDB: 12.11.2012
AB  - In this work we study the Pt/SrTiO3 (STO) interface system using X-ray photoelectron spectroscopy (XPS). The polycrystalline Pt layers with a thickness of about 2-3 nm are deposited by sputtering and thermal evaporation methods on STO(100) single crystals with two different type of terminations. We propose and show local conductivity (LC) measurements as a good method to check whether such very thin metal layers are continuous. The XPS data show that both methods of Pt deposition lead to changes of the chemical composition of the crystal surface layers, and such chemical instability should be taken into consideration when studying the physical properties of a metal-insulator interface.
KW  - J (WoSType)
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000249016500039
DO  - DOI:10.1007/s00339-007-4134-2
UR  - https://juser.fz-juelich.de/record/57726
ER  -