% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@ARTICLE{Psiuk:57726,
      author       = {Psiuk, B. and Szade, J. and Schroeder, H. and Haselier, H.
                      and Mlynarczyk, M. and Waser, R. and Szot, K.},
      title        = {{P}hotoemission study of {S}r{T}i{O}3 surface layers
                      instability upon metal deposition},
      journal      = {Applied physics / A},
      volume       = {89},
      issn         = {0947-8396},
      address      = {Berlin},
      publisher    = {Springer},
      reportid     = {PreJuSER-57726},
      pages        = {451 - 455},
      year         = {2007},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {In this work we study the Pt/SrTiO3 (STO) interface system
                      using X-ray photoelectron spectroscopy (XPS). The
                      polycrystalline Pt layers with a thickness of about 2-3 nm
                      are deposited by sputtering and thermal evaporation methods
                      on STO(100) single crystals with two different type of
                      terminations. We propose and show local conductivity (LC)
                      measurements as a good method to check whether such very
                      thin metal layers are continuous. The XPS data show that
                      both methods of Pt deposition lead to changes of the
                      chemical composition of the crystal surface layers, and such
                      chemical instability should be taken into consideration when
                      studying the physical properties of a metal-insulator
                      interface.},
      keywords     = {J (WoSType)},
      cin          = {CNI / IFF-6 / JARA-FIT},
      ddc          = {530},
      cid          = {I:(DE-Juel1)VDB381 / I:(DE-Juel1)VDB786 /
                      $I:(DE-82)080009_20140620$},
      pnm          = {Grundlagen für zukünftige Informationstechnologien},
      pid          = {G:(DE-Juel1)FUEK412},
      shelfmark    = {Materials Science, Multidisciplinary / Physics, Applied},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000249016500039},
      doi          = {10.1007/s00339-007-4134-2},
      url          = {https://juser.fz-juelich.de/record/57726},
}