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001     57738
005     20200423204505.0
024 7 _ |a 10.1103/PhysRevLett.96.106103
|2 DOI
024 7 _ |a WOS:000236062800055
|2 WOS
024 7 _ |a 2128/7715
|2 Handle
037 _ _ |a PreJuSER-57738
041 _ _ |a eng
082 _ _ |a 550
084 _ _ |2 WoS
|a Physics, Multidisciplinary
100 1 _ |a Redinger, A.
|b 0
|0 P:(DE-HGF)0
245 _ _ |a Superior regularity in erosion patterns by planar subsurface channeling
260 _ _ |a College Park, Md.
|b APS
|c 2006
300 _ _ |a 106103
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|0 0
|2 EndNote
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
440 _ 0 |a Physical Review Letters
|x 0031-9007
|0 4925
|v 96
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a The onset of pattern formation through exposure of Pt(111) with 5 keV Ar+ ions at grazing incidence has been studied at 550 K by scanning tunneling microscopy and is supplemented by molecular-dynamics simulations of single ion impacts. A consistent description of pattern formation in terms of atomic scale mechanisms is given. Most surprisingly, pattern formation depends crucially on the angle of incidence of the ions. As soon as this angle allows subsurface channeling of the ions, pattern regularity and alignment with respect to the ion beam greatly improves. These effects are traced back to the positionally aligned formation of vacancy islands through the damage created by the ions at dechanneling locations.
536 _ _ |a Grundlagen für zukünftige Informationstechnologien
|c P42
|2 G:(DE-HGF)
|0 G:(DE-Juel1)FUEK412
|x 0
588 _ _ |a Dataset connected to Web of Science
650 _ 7 |a J
|2 WoSType
700 1 _ |a Hansen, H.
|b 1
|0 P:(DE-HGF)0
700 1 _ |a Linke, U.
|b 2
|u FZJ
|0 P:(DE-Juel1)VDB23435
700 1 _ |a Rosandi, Y.
|b 3
|0 P:(DE-HGF)0
700 1 _ |a Urbassek, H. M.
|b 4
|0 P:(DE-HGF)0
700 1 _ |a Michely, T.
|b 5
|0 P:(DE-HGF)0
773 _ _ |a 10.1103/PhysRevLett.96.106103
|g Vol. 96, p. 106103
|p 106103
|q 96<106103
|0 PERI:(DE-600)1472655-5
|t Physical review letters
|v 96
|y 2006
|x 0031-9007
856 7 _ |u http://dx.doi.org/10.1103/PhysRevLett.96.106103
856 4 _ |u https://juser.fz-juelich.de/record/57738/files/FZJ-57738.pdf
|y OpenAccess
|z Published final document.
856 4 _ |u https://juser.fz-juelich.de/record/57738/files/FZJ-57738.jpg?subformat=icon-1440
|x icon-1440
|y OpenAccess
856 4 _ |u https://juser.fz-juelich.de/record/57738/files/FZJ-57738.jpg?subformat=icon-180
|x icon-180
|y OpenAccess
856 4 _ |u https://juser.fz-juelich.de/record/57738/files/FZJ-57738.jpg?subformat=icon-640
|x icon-640
|y OpenAccess
909 C O |o oai:juser.fz-juelich.de:57738
|p openaire
|p open_access
|p driver
|p VDB
|p dnbdelivery
913 1 _ |k P42
|v Grundlagen für zukünftige Informationstechnologien
|l Grundlagen für zukünftige Informationstechnologien (FIT)
|b Schlüsseltechnologien
|0 G:(DE-Juel1)FUEK412
|x 0
914 1 _ |a Nachtrag
|y 2006
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
915 _ _ |a OpenAccess
|0 StatID:(DE-HGF)0510
|2 StatID
915 _ _ |a American Physical Society Transfer of Copyright Agreement
|0 LIC:(DE-HGF)APS-112012
|2 HGFVOC
920 1 _ |k ISG-3
|l Institut für Grenzflächen und Vakuumtechnologien
|d 31.12.2006
|g ISG
|0 I:(DE-Juel1)VDB43
|x 1
920 1 _ |k CNI
|l Center of Nanoelectronic Systems for Information Technology
|d 14.09.2008
|g CNI
|z 381
|0 I:(DE-Juel1)VDB381
|x 2
970 _ _ |a VDB:(DE-Juel1)90832
980 _ _ |a VDB
980 _ _ |a ConvertedRecord
980 _ _ |a journal
980 _ _ |a I:(DE-Juel1)PGI-3-20110106
980 _ _ |a I:(DE-Juel1)VDB381
980 _ _ |a UNRESTRICTED
980 _ _ |a FullTexts
980 1 _ |a FullTexts
981 _ _ |a I:(DE-Juel1)PGI-3-20110106
981 _ _ |a I:(DE-Juel1)VDB381

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