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000057739 0247_ $$2DOI$$a10.1021/la051856q
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000057739 041__ $$aeng
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000057739 084__ $$2WoS$$aChemistry, Multidisciplinary
000057739 084__ $$2WoS$$aChemistry, Physical
000057739 084__ $$2WoS$$aMaterials Science, Multidisciplinary
000057739 1001_ $$0P:(DE-HGF)0$$aLee, H.$$b0
000057739 245__ $$aCharacterization of molecular linkages placed between zeolite microcrystal monolayers and a substrate with X-ray reflectivity
000057739 260__ $$aWashington, DC$$bACS Publ.$$c2006
000057739 300__ $$a2598 - 2604
000057739 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article
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000057739 440_0 $$04081$$aLangmuir$$v22$$x0743-7463$$y6
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000057739 520__ $$aWe prepared silicalite-1 microcrystal (MC) monolayers on a Si wafer using two different types of molecular linkages, namely, through chloropropyl (CP) groups and through CP/polyethylene imine/CP groups. Whereas the scanning electron microscope images of the two MC monolayers look very much alike but hardly give any information on the nature of molecular linkage between the monolayers and the substrate, their reflectivity curves are distinctively different, despite the fact that the thicknesses of the molecular linkage layers ( approximately 10-20 A) are negligibly small compared to the thicknesses of MC monolayers, ( approximately 3200 A). On the basis of the atomic force microscopic images of the MC surfaces, a rough surface layer with the thickness of approximately 160 A was introduced onto the surface of each MC to conduct a meaningful simulation of the curves with the recursive Parratt formalism. The obtained thickness, roughness, and density of each layer were reasonable, indicating that X-ray reflectivity is a very useful tool for the characterization of very thin layers of molecular linkages existing between much thicker MC monolayers and the substrate.
000057739 536__ $$0G:(DE-Juel1)FUEK414$$2G:(DE-HGF)$$aKondensierte Materie$$cP54$$x0
000057739 588__ $$aDataset connected to Web of Science, Pubmed
000057739 650_2 $$2MeSH$$aMicroscopy, Electron, Scanning
000057739 650_2 $$2MeSH$$aSpectrophotometry, Ultraviolet
000057739 650_2 $$2MeSH$$aX-Rays
000057739 650_2 $$2MeSH$$aZeolites: chemistry
000057739 650_7 $$01318-02-1$$2NLM Chemicals$$aZeolites
000057739 650_7 $$2WoSType$$aJ
000057739 7001_ $$0P:(DE-HGF)0$$aPark, J. S.$$b1
000057739 7001_ $$0P:(DE-HGF)0$$aKim, H.$$b2
000057739 7001_ $$0P:(DE-HGF)0$$aYoon, K. B.$$b3
000057739 7001_ $$0P:(DE-Juel1)VDB5734$$aSeeck, O. H.$$b4$$uFZJ
000057739 7001_ $$0P:(DE-HGF)0$$aKim, D. H.$$b5
000057739 7001_ $$0P:(DE-HGF)0$$aSeo, S. H.$$b6
000057739 7001_ $$0P:(DE-HGF)0$$aKang, H. C.$$b7
000057739 7001_ $$0P:(DE-HGF)0$$aNoh, D. Y.$$b8
000057739 773__ $$0PERI:(DE-600)2005937-1$$a10.1021/la051856q$$gVol. 22, p. 2598 - 2604$$p2598 - 2604$$q22<2598 - 2604$$tLangmuir$$v22$$x0743-7463$$y2006
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000057739 9131_ $$0G:(DE-Juel1)FUEK414$$bMaterie$$kP54$$lKondensierte Materie$$vKondensierte Materie$$x0$$zentfällt   bis 2009
000057739 9141_ $$aNachtrag$$y2006
000057739 915__ $$0StatID:(DE-HGF)0010$$aJCR/ISI refereed
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