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@ARTICLE{Lee:57739,
      author       = {Lee, H. and Park, J. S. and Kim, H. and Yoon, K. B. and
                      Seeck, O. H. and Kim, D. H. and Seo, S. H. and Kang, H. C.
                      and Noh, D. Y.},
      title        = {{C}haracterization of molecular linkages placed between
                      zeolite microcrystal monolayers and a substrate with {X}-ray
                      reflectivity},
      journal      = {Langmuir},
      volume       = {22},
      issn         = {0743-7463},
      address      = {Washington, DC},
      publisher    = {ACS Publ.},
      reportid     = {PreJuSER-57739},
      pages        = {2598 - 2604},
      year         = {2006},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {We prepared silicalite-1 microcrystal (MC) monolayers on a
                      Si wafer using two different types of molecular linkages,
                      namely, through chloropropyl (CP) groups and through
                      CP/polyethylene imine/CP groups. Whereas the scanning
                      electron microscope images of the two MC monolayers look
                      very much alike but hardly give any information on the
                      nature of molecular linkage between the monolayers and the
                      substrate, their reflectivity curves are distinctively
                      different, despite the fact that the thicknesses of the
                      molecular linkage layers ( approximately 10-20 A) are
                      negligibly small compared to the thicknesses of MC
                      monolayers, ( approximately 3200 A). On the basis of the
                      atomic force microscopic images of the MC surfaces, a rough
                      surface layer with the thickness of approximately 160 A was
                      introduced onto the surface of each MC to conduct a
                      meaningful simulation of the curves with the recursive
                      Parratt formalism. The obtained thickness, roughness, and
                      density of each layer were reasonable, indicating that X-ray
                      reflectivity is a very useful tool for the characterization
                      of very thin layers of molecular linkages existing between
                      much thicker MC monolayers and the substrate.},
      keywords     = {Microscopy, Electron, Scanning / Spectrophotometry,
                      Ultraviolet / X-Rays / Zeolites: chemistry / Zeolites (NLM
                      Chemicals) / J (WoSType)},
      cin          = {IFF-ISM},
      ddc          = {670},
      cid          = {I:(DE-Juel1)VDB342},
      pnm          = {Kondensierte Materie},
      pid          = {G:(DE-Juel1)FUEK414},
      shelfmark    = {Chemistry, Multidisciplinary / Chemistry, Physical /
                      Materials Science, Multidisciplinary},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {pmid:16519459},
      UT           = {WOS:000236009900033},
      doi          = {10.1021/la051856q},
      url          = {https://juser.fz-juelich.de/record/57739},
}