Home > Publications database > Characterization of molecular linkages placed between zeolite microcrystal monolayers and a substrate with X-ray reflectivity > print

001     57739
005     20240529111433.0
024 7 _ |2 pmid
|a pmid:16519459
024 7 _ |2 DOI
|a 10.1021/la051856q
024 7 _ |2 WOS
|a WOS:000236009900033
037 _ _ |a PreJuSER-57739
041 _ _ |a eng
082 _ _ |a 670
084 _ _ |2 WoS
|a Chemistry, Multidisciplinary
084 _ _ |2 WoS
|a Chemistry, Physical
084 _ _ |2 WoS
|a Materials Science, Multidisciplinary
100 1 _ |a Lee, H.
|b 0
|0 P:(DE-HGF)0
245 _ _ |a Characterization of molecular linkages placed between zeolite microcrystal monolayers and a substrate with X-ray reflectivity
260 _ _ |a Washington, DC
|b ACS Publ.
|c 2006
300 _ _ |a 2598 - 2604
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|0 0
|2 EndNote
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
440 _ 0 |a Langmuir
|x 0743-7463
|0 4081
|y 6
|v 22
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a We prepared silicalite-1 microcrystal (MC) monolayers on a Si wafer using two different types of molecular linkages, namely, through chloropropyl (CP) groups and through CP/polyethylene imine/CP groups. Whereas the scanning electron microscope images of the two MC monolayers look very much alike but hardly give any information on the nature of molecular linkage between the monolayers and the substrate, their reflectivity curves are distinctively different, despite the fact that the thicknesses of the molecular linkage layers ( approximately 10-20 A) are negligibly small compared to the thicknesses of MC monolayers, ( approximately 3200 A). On the basis of the atomic force microscopic images of the MC surfaces, a rough surface layer with the thickness of approximately 160 A was introduced onto the surface of each MC to conduct a meaningful simulation of the curves with the recursive Parratt formalism. The obtained thickness, roughness, and density of each layer were reasonable, indicating that X-ray reflectivity is a very useful tool for the characterization of very thin layers of molecular linkages existing between much thicker MC monolayers and the substrate.
536 _ _ |a Kondensierte Materie
|c P54
|2 G:(DE-HGF)
|0 G:(DE-Juel1)FUEK414
|x 0
588 _ _ |a Dataset connected to Web of Science, Pubmed
650 _ 2 |2 MeSH
|a Microscopy, Electron, Scanning
650 _ 2 |2 MeSH
|a Spectrophotometry, Ultraviolet
650 _ 2 |2 MeSH
|a X-Rays
650 _ 2 |2 MeSH
|a Zeolites: chemistry
650 _ 7 |0 1318-02-1
|2 NLM Chemicals
|a Zeolites
650 _ 7 |a J
|2 WoSType
700 1 _ |a Park, J. S.
|b 1
|0 P:(DE-HGF)0
700 1 _ |a Kim, H.
|b 2
|0 P:(DE-HGF)0
700 1 _ |a Yoon, K. B.
|b 3
|0 P:(DE-HGF)0
700 1 _ |a Seeck, O. H.
|b 4
|u FZJ
|0 P:(DE-Juel1)VDB5734
700 1 _ |a Kim, D. H.
|b 5
|0 P:(DE-HGF)0
700 1 _ |a Seo, S. H.
|b 6
|0 P:(DE-HGF)0
700 1 _ |a Kang, H. C.
|b 7
|0 P:(DE-HGF)0
700 1 _ |a Noh, D. Y.
|b 8
|0 P:(DE-HGF)0
773 _ _ |a 10.1021/la051856q
|g Vol. 22, p. 2598 - 2604
|p 2598 - 2604
|q 22<2598 - 2604
|0 PERI:(DE-600)2005937-1
|t Langmuir
|v 22
|y 2006
|x 0743-7463
909 C O |o oai:juser.fz-juelich.de:57739
|p VDB
913 1 _ |k P54
|v Kondensierte Materie
|l Kondensierte Materie
|b Materie
|z entfällt bis 2009
|0 G:(DE-Juel1)FUEK414
|x 0
914 1 _ |a Nachtrag
|y 2006
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
920 1 _ |k IFF-ISM
|l Streumethoden
|d 31.12.2006
|g IFF
|0 I:(DE-Juel1)VDB342
|x 1
970 _ _ |a VDB:(DE-Juel1)90833
980 _ _ |a VDB
980 _ _ |a ConvertedRecord
980 _ _ |a journal
980 _ _ |a I:(DE-Juel1)PGI-4-20110106
980 _ _ |a UNRESTRICTED
981 _ _ |a I:(DE-Juel1)JCNS-2-20110106
981 _ _ |a I:(DE-Juel1)PGI-4-20110106

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