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000058039 0247_ $$2DOI$$a10.1080/10584580500312644
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000058039 084__ $$2WoS$$aEngineering, Electrical & Electronic
000058039 084__ $$2WoS$$aPhysics, Applied
000058039 084__ $$2WoS$$aPhysics, Condensed Matter
000058039 1001_ $$0P:(DE-Juel1)VDB70200$$aMustafa, Y.$$b0$$uFZJ
000058039 245__ $$aA dynamic reference scheme for nonvolatile ferroelectric RAM
000058039 260__ $$aLondon [u.a.]$$bTaylor & Francis$$c2005
000058039 300__ $$a31 - 37
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000058039 440_0 $$02659$$aIntegrated Ferroelectrics$$v72$$x1058-4587
000058039 500__ $$aRecord converted from VDB: 12.11.2012
000058039 520__ $$aWe report on a novel reference voltage scheme for FRAMs which solves most problems like fatigue, temperature dependency, voltage drop, etc still present in other reference schemes: dynamic reference scheme. It tracks the variations of the ferroelectric capacitors in the memory and provides a common reference voltage line for all sense amplifiers on chip or different reference voltages for different memory banks. No dedicated reference cells are required, instead the memory cells themselves are utilized to generate the reference voltage by periodical test of their voltage levels or by setting a signal that starts the test. This scheme extends life-time and reliability of the memory and enables a self test and repair capability.
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000058039 65320 $$2Author$$adynamic reference voltage
000058039 65320 $$2Author$$anon destructive
000058039 65320 $$2Author$$aFRAM
000058039 65320 $$2Author$$acalibration
000058039 7001_ $$0P:(DE-Juel1)VDB3114$$aRickes, J. T.$$b1$$uFZJ
000058039 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b2$$uFZJ
000058039 7001_ $$0P:(DE-HGF)0$$aMcAdams, H.P.$$b3
000058039 773__ $$0PERI:(DE-600)2037916-X$$a10.1080/10584580500312644$$gVol. 72, p. 31 - 37$$p31 - 37$$q72<31 - 37$$tIntegrated ferroelectrics$$v72$$x1058-4587$$y2005
000058039 8567_ $$uhttp://dx.doi.org/10.1080/10584580500312644
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000058039 9141_ $$aNachtrag$$y2005
000058039 915__ $$0StatID:(DE-HGF)0010$$aJCR/ISI refereed
000058039 9201_ $$0I:(DE-Juel1)VDB321$$d31.12.2006$$gIFF$$kIFF-IEM$$lElektronische Materialien$$x0
000058039 9201_ $$0I:(DE-Juel1)VDB381$$d14.09.2008$$gCNI$$kCNI$$lCenter of Nanoelectronic Systems for Information Technology$$x1$$z381
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