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000058040 1001_ $$0P:(DE-HGF)0$$aGerber, P.$$b0
000058040 245__ $$aEffects of reversible and irreversible ferroelectric switching on the piezoelectric large-signal response of PZT thin films
000058040 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2005
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000058040 520__ $$aThe effects of reversible and irreversible switching processes on the electromechanical large-signal strain S of tetragonal Pb(Zr-x,Ti1-x)O-3 thin films are investigated and discussed. Starting from electric small- and large-signal measurements, the percentage of switched unit cells ce(sw) is calculated. The result is then used in combination with the measured electromechanical field-induced small-signal response to calculate the field-induced large-signal strain S. Enhanced models for this calculation are developed improving a known model. Differences between the calculated and measured large-signal strains are discussed in respect to parameter influences and irreversible contributions. In addition, detailed insight on the switching processes in respect to the electromechanical properties is given. (c) 2005 American Institute of Physics.
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000058040 7001_ $$0P:(DE-HGF)0$$aKuegeler, C.$$b1
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000058040 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b3$$uFZJ
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