001     58046
005     20180211164046.0
024 7 _ |2 DOI
|a 10.1063/1.2200470
024 7 _ |2 WOS
|a WOS:000238314900073
037 _ _ |a PreJuSER-58046
041 _ _ |a eng
082 _ _ |a 530
084 _ _ |2 WoS
|a Physics, Applied
100 1 _ |a Schorn, P. J.
|b 0
|0 P:(DE-HGF)0
245 _ _ |a Fatigue effect in ferroelectric PbZr1-xTixO3 thin films
260 _ _ |a Bristol
|b IOP Publ.
|c 2006
300 _ _ |a 114104-1 - 114104-5
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
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336 7 _ |a Journal Article
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336 7 _ |a ARTICLE
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336 7 _ |a JOURNAL_ARTICLE
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336 7 _ |a article
|2 DRIVER
440 _ 0 |a Journal of Physics D - Applied Physics
|x 0022-3727
|0 3700
|y 11
|v 99
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a PbZr1-xTixO3 (PZT) is one preferred ferroelectric material being used in nonvolatile ferroelectric random access memory devices. The use of oxide electrodes like IrO2 or SrRuO3 (SRO) is necessary to suppress the serious loss of polarization due to bipolar voltage cycling. Although, there are a number of models under discussion, the origin of the fatigue phenomenon is still not completely understood. In this paper, the fatigue effect of ferroelectric Pb(Zr-0.40,Ti-0.60)O-3 thin films has been studied in detail. To achieve a deeper understanding of the effect, several PZT samples with different electrode materials were investigated. After determining the dependence of the single fatigue parameters, a simulation approach was made to analyze the fatigue effect qualitatively. A sample with SRO electrodes was measured up to 10(13) cycles and no fatigue of the switchable polarization was observed. (c) 2006 American Institute of Physics.
536 _ _ |a Grundlagen für zukünftige Informationstechnologien
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588 _ _ |a Dataset connected to Web of Science
650 _ 7 |a J
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700 1 _ |a Bräuhaus, D.
|b 1
|0 P:(DE-HGF)0
700 1 _ |a Böttger, U.
|b 2
|0 P:(DE-HGF)0
700 1 _ |a Waser, R.
|b 3
|u FZJ
|0 P:(DE-Juel1)131022
773 _ _ |a 10.1063/1.2200470
|g Vol. 99, p. 114104-1 - 114104-5
|p 114104-1 - 114104-5
|q 99<114104-1 - 114104-5
|0 PERI:(DE-600)1472948-9
|t Journal of physics / D
|v 99
|y 2006
|x 0022-3727
856 7 _ |u http://dx.doi.org/10.1063/1.2200470
909 C O |o oai:juser.fz-juelich.de:58046
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913 1 _ |k P42
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914 1 _ |y 2006
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
920 1 _ |d 31.12.2010
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|l Elektronische Materialien
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920 1 _ |d 14.09.2008
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920 1 _ |0 I:(DE-82)080009_20140620
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