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@ARTICLE{Kever:58103,
author = {Kever, T. and Böttger, U. and Schindler, C. and Waser, R.},
title = {{O}n the origin of bistable resistive switching in metal
organic charge transfer complex memory cells},
journal = {Applied physics letters},
volume = {91},
issn = {0003-6951},
address = {Melville, NY},
publisher = {American Institute of Physics},
reportid = {PreJuSER-58103},
pages = {083506},
year = {2007},
note = {Record converted from VDB: 12.11.2012},
abstract = {Electrical characteristics of Cu:tetracyanoquinodimethane
(TCNQ) devices with different electrodes were studied. The
comparison of impedance spectroscopic measurements on
devices with Al and Pt top electrodes proved the existence
of a high resistive interface layer between Cu:TCNQ and Al.
An equivalent circuit was modeled and the resulting values
suggest that the interface layer is composed of naturally
formed aluminum oxide. Devices with deliberately formed
aluminum oxide and without Cu:TCNQ were fabricated and
revealed a similar behavior. The authors propose that the
switching effect in Cu:TCNQ thin film devices is a Cu ion
based electrochemical effect occurring in a thin aluminum
oxide layer. (C) 2007 American Institute of Physics.},
keywords = {J (WoSType)},
cin = {IFF-6 / CNI / JARA-FIT},
ddc = {530},
cid = {I:(DE-Juel1)VDB786 / I:(DE-Juel1)VDB381 /
$I:(DE-82)080009_20140620$},
pnm = {Grundlagen für zukünftige Informationstechnologien},
pid = {G:(DE-Juel1)FUEK412},
shelfmark = {Physics, Applied},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000248984800096},
doi = {10.1063/1.2772191},
url = {https://juser.fz-juelich.de/record/58103},
}