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@ARTICLE{Petraru:58230,
      author       = {Petraru, A. and Pertsev, N. A. and Kohlstedt, H. H. and
                      Poppe, U. and Waser, R. and Solbach, A. and Klemradt, U.},
      title        = {{P}olarization and lattice strains in epitaxial
                      {B}a{T}i{O}3 films grown by high-pressure sputtering},
      journal      = {Journal of applied physics},
      volume       = {101},
      issn         = {0021-8979},
      address      = {Melville, NY},
      publisher    = {American Institute of Physics},
      reportid     = {PreJuSER-58230},
      pages        = {114106},
      year         = {2007},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {High-quality BaTiO3 films with thicknesses ranging from 2.9
                      to 175 nm were grown epitaxially on SrRuO3-covered
                      (001)-oriented SrTiO3 substrates by high-pressure
                      sputtering. The crystal structure of these films was studied
                      by conventional and synchrotron x-ray diffraction. The
                      in-plane and out-of-plane lattice parameters were determined
                      as a function of film thickness by x-ray reciprocal space
                      mapping around the asymmetric ((1) over bar 03) Bragg
                      reflection. BaTiO3 films were found to be fully strained by
                      the SrTiO3 substrate up to a thickness of about 30 nm.
                      Ferroelectric capacitors were then fabricated by depositing
                      SrRuO3 top electrodes, and the polarization-voltage
                      hysteresis loops were recorded at the frequencies 1-30 kHz.
                      The observed thickness effect on the lattice parameters and
                      polarization in BaTiO3 films was analyzed in the light of
                      strain and depolarizing-field effects using the nonlinear
                      thermodynamics theory. The theoretical predictions are in
                      reasonable agreement with the measured thickness
                      dependences, although the maximum experimental values of the
                      spontaneous polarization and the out-of-plane lattice
                      parameter exceed the theoretical estimates (43 mu C/cm(2) vs
                      35 mu C/cm(2) and 4.166 angstrom vs 4.143 angstrom).
                      Possible origins of the revealed discrepancy between theory
                      and experiment are discussed. (c) 2007 American Institute of
                      Physics.},
      keywords     = {J (WoSType)},
      cin          = {CNI / IFF-6 / IFF-8 / JARA-FIT},
      ddc          = {530},
      cid          = {I:(DE-Juel1)VDB381 / I:(DE-Juel1)VDB786 /
                      I:(DE-Juel1)VDB788 / $I:(DE-82)080009_20140620$},
      pnm          = {Grundlagen für zukünftige Informationstechnologien},
      pid          = {G:(DE-Juel1)FUEK412},
      shelfmark    = {Physics, Applied},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000247306000113},
      doi          = {10.1063/1.2745277},
      url          = {https://juser.fz-juelich.de/record/58230},
}