Hauptseite > Publikationsdatenbank > Kondo effect by controlled cleavage of a single-molecule contact > print |
001 | 60999 | ||
005 | 20190625111327.0 | ||
024 | 7 | _ | |2 pmid |a pmid:21730697 |
024 | 7 | _ | |2 DOI |a 10.1088/0957-4484/19/6/065401 |
024 | 7 | _ | |2 WOS |a WOS:000252967200004 |
024 | 7 | _ | |a altmetric:21818342 |2 altmetric |
037 | _ | _ | |a PreJuSER-60999 |
041 | _ | _ | |a eng |
082 | _ | _ | |a 530 |
084 | _ | _ | |2 WoS |a Nanoscience & Nanotechnology |
084 | _ | _ | |2 WoS |a Materials Science, Multidisciplinary |
084 | _ | _ | |2 WoS |a Physics, Applied |
100 | 1 | _ | |0 P:(DE-Juel1)VDB73384 |a Temirov, R. |b 0 |u FZJ |
245 | _ | _ | |a Kondo effect by controlled cleavage of a single-molecule contact |
260 | _ | _ | |a Bristol |b IOP Publ. |c 2008 |
300 | _ | _ | |a 065401 |
336 | 7 | _ | |0 PUB:(DE-HGF)16 |2 PUB:(DE-HGF) |a Journal Article |
336 | 7 | _ | |2 DataCite |a Output Types/Journal article |
336 | 7 | _ | |0 0 |2 EndNote |a Journal Article |
336 | 7 | _ | |2 BibTeX |a ARTICLE |
336 | 7 | _ | |2 ORCID |a JOURNAL_ARTICLE |
336 | 7 | _ | |2 DRIVER |a article |
440 | _ | 0 | |0 4475 |a Nanotechnology |v 19 |x 0957-4484 |
500 | _ | _ | |a Record converted from VDB: 12.11.2012 |
520 | _ | _ | |a Conductance measurements of a molecular wire, contacted between an epitaxial molecule-metal bond and the tip of a scanning tunnelling microscope, are reported. Controlled retraction of the tip gradually de-hybridizes the molecule from the metal substrate. This tunes the wire into the Kondo regime in which the renormalized molecular transport orbital serves as a spin impurity at half-filling and the Kondo resonance opens up an additional transport channel. Numerical renormalization group simulations suggest this type of behaviour to be generic for a common class of metal-molecule bonds. The results demonstrate a new approach to single-molecule experiments with atomic-scale contact control and prepare the way for the ab initio simulation of many-body transport through single-molecule junctions. |
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588 | _ | _ | |a Dataset connected to Web of Science, Pubmed |
650 | _ | 7 | |2 WoSType |a J |
700 | 1 | _ | |0 P:(DE-HGF)0 |a Lassise, A. |b 1 |
700 | 1 | _ | |0 P:(DE-HGF)0 |a Anders, F. B. |b 2 |
700 | 1 | _ | |0 P:(DE-Juel1)128791 |a Tautz, F. S. |b 3 |u FZJ |
773 | _ | _ | |0 PERI:(DE-600)1362365-5 |a 10.1088/0957-4484/19/6/065401 |g Vol. 19, p. 065401 |p 065401 |q 19<065401 |t Nanotechnology |v 19 |x 0957-4484 |y 2008 |
856 | 7 | _ | |u http://dx.doi.org/10.1088/0957-4484/19/6/065401 |
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913 | 1 | _ | |0 G:(DE-Juel1)FUEK412 |b Schlüsseltechnologien |k P42 |l Grundlagen für zukünftige Informationstechnologien (FIT) |v Grundlagen für zukünftige Informationstechnologien |x 0 |
914 | 1 | _ | |y 2008 |
915 | _ | _ | |0 StatID:(DE-HGF)0010 |a JCR/ISI refereed |
920 | 1 | _ | |0 I:(DE-Juel1)VDB801 |d 31.12.2010 |g IBN |k IBN-3 |l Grenz- und Oberflächen |x 0 |
920 | 1 | _ | |0 I:(DE-Juel1)VDB381 |d 14.09.2008 |g CNI |k CNI |l Center of Nanoelectronic Systems for Information Technology |x 1 |z 381 |
920 | 1 | _ | |0 I:(DE-82)080009_20140620 |g JARA |k JARA-FIT |l Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology |x 2 |
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