000061899 001__ 61899
000061899 005__ 20180211184707.0
000061899 0247_ $$2DOI$$a10.1007/s00339-007-4085-7
000061899 0247_ $$2WOS$$aWOS:000248064100036
000061899 0247_ $$2ISSN$$a0947-8396
000061899 037__ $$aPreJuSER-61899
000061899 041__ $$aeng
000061899 082__ $$a530
000061899 084__ $$2WoS$$aMaterials Science, Multidisciplinary
000061899 084__ $$2WoS$$aPhysics, Applied
000061899 1001_ $$0P:(DE-HGF)0$$aKrasyuk, A.$$b0
000061899 245__ $$aMagnetic stray fields of patterned permalloy structures investigated by photoemission electron microscopy
000061899 260__ $$aBerlin$$bSpringer$$c2007
000061899 300__ $$a793 - 796
000061899 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article
000061899 3367_ $$2DataCite$$aOutput Types/Journal article
000061899 3367_ $$00$$2EndNote$$aJournal Article
000061899 3367_ $$2BibTeX$$aARTICLE
000061899 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000061899 3367_ $$2DRIVER$$aarticle
000061899 440_0 $$0560$$aApplied Physics A$$v88$$x0947-8396$$y4
000061899 500__ $$aRecord converted from VDB: 12.11.2012
000061899 520__ $$aUsing a photoemission electron microscope we determined magnetic stray fields at the edges of permalloy (Ni80Fe20) particles. X-ray magnetic dichroism was used for visualization of magnetic domains. The values of the stray fields were deduced from the deflection of electrons in the image due to the Lorentz force. The stray fields are responsible for the magnetic interaction of adjacent particles with distances much larger than the thickness. The measured magnetic stray field is about 0.023 T for rectangular particles with a thickness of 30 nm and lateral sizes of tens of microns.
000061899 536__ $$0G:(DE-Juel1)FUEK414$$2G:(DE-HGF)$$aKondensierte Materie$$cP54$$x0
000061899 588__ $$aDataset connected to Web of Science
000061899 650_7 $$2WoSType$$aJ
000061899 7001_ $$0P:(DE-HGF)0$$aNepijko, S. A.$$b1
000061899 7001_ $$0P:(DE-HGF)0$$aOelsner, A.$$b2
000061899 7001_ $$0P:(DE-Juel1)130948$$aSchneider, C. M.$$b3$$uFZJ
000061899 7001_ $$0P:(DE-HGF)0$$aElmers, H. J.$$b4
000061899 7001_ $$0P:(DE-HGF)0$$aSchönhense, G.$$b5
000061899 773__ $$0PERI:(DE-600)1398311-8$$a10.1007/s00339-007-4085-7$$gVol. 88, p. 793 - 796$$p793 - 796$$q88<793 - 796$$tApplied physics / A$$v88$$x0947-8396$$y2007
000061899 8567_ $$uhttp://dx.doi.org/10.1007/s00339-007-4085-7
000061899 909CO $$ooai:juser.fz-juelich.de:61899$$pVDB
000061899 9131_ $$0G:(DE-Juel1)FUEK414$$bMaterie$$kP54$$lKondensierte Materie$$vKondensierte Materie$$x0$$zentfällt   bis 2009
000061899 9141_ $$aNachtrag$$y2007
000061899 915__ $$0StatID:(DE-HGF)0010$$2StatID$$aJCR/ISI refereed
000061899 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR
000061899 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000061899 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000061899 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000061899 9201_ $$0I:(DE-Juel1)VDB786$$d31.12.2010$$gIFF$$kIFF-6$$lElektronische Materialien$$x1
000061899 9201_ $$0I:(DE-82)080009_20140620$$gJARA$$kJARA-FIT$$lJülich-Aachen Research Alliance - Fundamentals of Future Information Technology$$x2
000061899 970__ $$aVDB:(DE-Juel1)97634
000061899 980__ $$aVDB
000061899 980__ $$aConvertedRecord
000061899 980__ $$ajournal
000061899 980__ $$aI:(DE-Juel1)PGI-7-20110106
000061899 980__ $$aI:(DE-82)080009_20140620
000061899 980__ $$aUNRESTRICTED
000061899 981__ $$aI:(DE-Juel1)PGI-7-20110106
000061899 981__ $$aI:(DE-Juel1)VDB881