001     61939
005     20180211180430.0
024 7 _ |2 DOI
|a 10.1016/j.apsusc.2007.07.125
024 7 _ |2 WOS
|a WOS:000250800100024
037 _ _ |a PreJuSER-61939
041 _ _ |a eng
082 _ _ |a 670
084 _ _ |2 WoS
|a Chemistry, Physical
084 _ _ |2 WoS
|a Materials Science, Coatings & Films
084 _ _ |2 WoS
|a Physics, Applied
084 _ _ |2 WoS
|a Physics, Condensed Matter
100 1 _ |0 P:(DE-HGF)0
|a Pedio, M.
|b 0
245 _ _ |a Growth of Pentaceneon Ag(111) surface: A NEXAFS study
260 _ _ |a Amsterdam
|b North-Holland
|c 2007
300 _ _ |a 103 - 107
336 7 _ |0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
|a Journal Article
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|a Journal Article
336 7 _ |2 BibTeX
|a ARTICLE
336 7 _ |2 ORCID
|a JOURNAL_ARTICLE
336 7 _ |2 DRIVER
|a article
440 _ 0 |0 573
|a Applied Surface Science
|v 254
|x 0169-4332
|y 1
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a Thin films of pentacene (C22H14) have become widely used in the field of organic electronics. Here films of C22H14 of thickness ranging from submonolayer to multilayer were thermally deposited on Ag(1 1 1) surface. The determination of molecular geometry in pentacene films on Ag(1 1 1) studied by X-ray absorption at different stages of growth up to one monolayer is presented.XAS spectra at the C K-edge were collected as a function of the direction of the electric field at the surface. The different features of the spectra were assigned to resonances related to the various molecular unoccupied states by the comparison with the absorption coefficient of the pentacene gas phase. The transitions involving antibonding pi states show a pronounced angular dependence for all the measured coverages, from submonolayer to multilayer. The spectra analysis indicates a nearly planar chemisorption of the first pentacene layer with a tilt angle of 10 degrees. (C) 2007 Elsevier B.V. All rights reserved.
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650 _ 7 |2 WoSType
|a J
653 2 0 |2 Author
|a pentacene
653 2 0 |2 Author
|a Ag(111)
653 2 0 |2 Author
|a polymers and organic compounds
653 2 0 |2 Author
|a electron states at surfaces and interfaces
653 2 0 |2 Author
|a X-ray absorption spectroscopy
653 2 0 |2 Author
|a EXAFS
653 2 0 |2 Author
|a NEXAFS
653 2 0 |2 Author
|a XANES
653 2 0 |2 Author
|a etc.
653 2 0 |2 Author
|a thin film structure and morphology
700 1 _ |0 P:(DE-HGF)0
|a Doyle, B.
|b 1
700 1 _ |0 P:(DE-HGF)0
|a Mahne, N.
|b 2
700 1 _ |0 P:(DE-HGF)0
|a Giglia, A.
|b 3
700 1 _ |0 P:(DE-HGF)0
|a Borgatti, F.
|b 4
700 1 _ |0 P:(DE-HGF)0
|a Nannarone, S.
|b 5
700 1 _ |0 P:(DE-HGF)0
|a Henze, S. K. M.
|b 6
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|a Temirov, R.
|b 7
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700 1 _ |0 P:(DE-Juel1)128791
|a Tautz, F. S.
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700 1 _ |0 P:(DE-HGF)0
|a Casalis, L.
|b 9
700 1 _ |0 P:(DE-HGF)0
|a Hudej, R.
|b 10
700 1 _ |0 P:(DE-HGF)0
|a Danisman, M.F.
|b 11
700 1 _ |0 P:(DE-HGF)0
|a Nickel, B.
|b 12
773 _ _ |0 PERI:(DE-600)2002520-8
|a 10.1016/j.apsusc.2007.07.125
|g Vol. 254, p. 103 - 107
|p 103 - 107
|q 254<103 - 107
|t Applied surface science
|v 254
|x 0169-4332
|y 2007
856 7 _ |u http://dx.doi.org/10.1016/j.apsusc.2007.07.125
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