% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@ARTICLE{Freysoldt:62442,
      author       = {Freysoldt, C. and Eggert, P. and Rinke, P. and Schindlmayr,
                      A. and Scheffler, M.},
      title        = {{S}creening in two dimensions: {GW} calculations for
                      surfaces and thin films using the repeated-slab approach},
      journal      = {Physical review / B},
      volume       = {77},
      number       = {23},
      issn         = {1098-0121},
      address      = {College Park, Md.},
      publisher    = {APS},
      reportid     = {PreJuSER-62442},
      pages        = {235428},
      year         = {2008},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {In the context of photoelectron spectroscopy, the GW
                      approach has developed into the method of choice for
                      computing excitation spectra of weakly correlated bulk
                      systems and their surfaces. To employ the established
                      computational schemes that have been developed for
                      three-dimensional crystals, two-dimensional systems are
                      typically treated in the repeated-slab approach. In this
                      work we critically examine this approach and identify three
                      important aspects for which the treatment of long-range
                      screening in two dimensions differs from the bulk: (1)
                      anisotropy of the macroscopic screening, (2) k-point
                      sampling parallel to the surface, (3) periodic repetition
                      and slab-slab interaction. For prototypical semiconductor
                      (silicon) and ionic (NaCl) thin films we quantify the
                      individual contributions of points (1) to (3) and develop
                      robust and efficient correction schemes derived from the
                      classic theory of dielectric screening.},
      keywords     = {J (WoSType)},
      cin          = {IFF-1 / JARA-FIT / IAS-1},
      ddc          = {530},
      cid          = {I:(DE-Juel1)VDB781 / $I:(DE-82)080009_20140620$ /
                      I:(DE-Juel1)IAS-1-20090406},
      pnm          = {Grundlagen für zukünftige Informationstechnologien},
      pid          = {G:(DE-Juel1)FUEK412},
      shelfmark    = {Physics, Condensed Matter},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000257289500118},
      doi          = {10.1103/PhysRevB.77.235428},
      url          = {https://juser.fz-juelich.de/record/62442},
}