000062546 001__ 62546 000062546 005__ 20200402210510.0 000062546 0247_ $$2pmid$$apmid:18507415 000062546 0247_ $$2DOI$$a10.1021/la800728x 000062546 0247_ $$2WOS$$aWOS:000257101100036 000062546 037__ $$aPreJuSER-62546 000062546 041__ $$aeng 000062546 082__ $$a670 000062546 084__ $$2WoS$$aChemistry, Multidisciplinary 000062546 084__ $$2WoS$$aChemistry, Physical 000062546 084__ $$2WoS$$aMaterials Science, Multidisciplinary 000062546 1001_ $$0P:(DE-HGF)0$$aGordan, O. D.$$b0 000062546 245__ $$aOn Pattern Transfer in Replica Molding 000062546 260__ $$aWashington, DC$$bACS Publ.$$c2008 000062546 300__ $$a6636 - 6639 000062546 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article 000062546 3367_ $$2DataCite$$aOutput Types/Journal article 000062546 3367_ $$00$$2EndNote$$aJournal Article 000062546 3367_ $$2BibTeX$$aARTICLE 000062546 3367_ $$2ORCID$$aJOURNAL_ARTICLE 000062546 3367_ $$2DRIVER$$aarticle 000062546 440_0 $$04081$$aLangmuir$$v24$$x0743-7463 000062546 500__ $$aRecord converted from VDB: 12.11.2012 000062546 520__ $$aNano- and micromolding of elastic materials produces smoothed replicas of the mold structures. This limits the technique's resolution. Here we identified surface tension as the cause of smoothing and derived explicit equations for calculating molded feature shapes. The characteristic length scale for smoothing is given by the ratio of the interface tension to Young's modulus of the molded material. This approach offers the possibility to correct for the smoothing caused by surface tension during mold design. Moreover, it can be exploited to measure interface tension. 000062546 536__ $$0G:(DE-Juel1)FUEK412$$2G:(DE-HGF)$$aGrundlagen für zukünftige Informationstechnologien$$cP42$$x0 000062546 536__ $$0G:(DE-Juel1)FUEK414$$aKondensierte Materie$$cP54$$x1 000062546 588__ $$aDataset connected to Web of Science, Pubmed 000062546 650_7 $$2WoSType$$aJ 000062546 7001_ $$0P:(DE-HGF)0$$aPersson, B. N. J.$$b1 000062546 7001_ $$0P:(DE-Juel1)VDB57503$$aCesa, C. M.$$b2$$uFZJ 000062546 7001_ $$0P:(DE-Juel1)128707$$aMayer, D.$$b3$$uFZJ 000062546 7001_ $$0P:(DE-Juel1)VDB27696$$aHoffmann, B.$$b4$$uFZJ 000062546 7001_ $$0P:(DE-Juel1)VDB5493$$aDieluweit, S.$$b5$$uFZJ 000062546 7001_ $$0P:(DE-Juel1)128833$$aMerkel, R.$$b6$$uFZJ 000062546 773__ $$0PERI:(DE-600)2005937-1$$a10.1021/la800728x$$gVol. 24, p. 6636 - 6639$$p6636 - 6639$$q24<6636 - 6639$$tLangmuir$$v24$$x0743-7463$$y2008 000062546 8567_ $$uhttp://dx.doi.org/10.1021/la800728x 000062546 909CO $$ooai:juser.fz-juelich.de:62546$$pVDB 000062546 9131_ $$0G:(DE-Juel1)FUEK412$$bSchlüsseltechnologien$$kP42$$lGrundlagen für zukünftige Informationstechnologien (FIT)$$vGrundlagen für zukünftige Informationstechnologien$$x0 000062546 9131_ $$0G:(DE-Juel1)FUEK414$$bMaterie$$kP54$$lKondensierte Materie$$vKondensierte Materie$$x1$$zentfällt bis 2009 000062546 9141_ $$y2008 000062546 915__ $$0StatID:(DE-HGF)0010$$aJCR/ISI refereed 000062546 9201_ $$0I:(DE-Juel1)IBN-2-20090406$$d31.12.2010$$gIBN$$kIBN-2$$lBioelektronik$$x0 000062546 9201_ $$0I:(DE-Juel1)VDB381$$d14.09.2008$$gCNI$$kCNI$$lCenter of Nanoelectronic Systems for Information Technology$$x1$$z381 000062546 9201_ $$0I:(DE-Juel1)VDB802$$d31.12.2010$$gIBN$$kIBN-4$$lBiomechanik$$x2 000062546 9201_ $$0I:(DE-Juel1)VDB781$$d31.12.2010$$gIFF$$kIFF-1$$lQuanten-Theorie der Materialien$$x3 000062546 970__ $$aVDB:(DE-Juel1)99000 000062546 980__ $$aVDB 000062546 980__ $$aConvertedRecord 000062546 980__ $$ajournal 000062546 980__ $$aI:(DE-Juel1)IBN-2-20090406 000062546 980__ $$aI:(DE-Juel1)VDB381 000062546 980__ $$aI:(DE-Juel1)ICS-7-20110106 000062546 980__ $$aI:(DE-Juel1)PGI-1-20110106 000062546 980__ $$aUNRESTRICTED 000062546 981__ $$aI:(DE-Juel1)IBI-2-20200312 000062546 981__ $$aI:(DE-Juel1)VDB381 000062546 981__ $$aI:(DE-Juel1)ICS-7-20110106 000062546 981__ $$aI:(DE-Juel1)PGI-1-20110106