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001     62546
005     20200402210510.0
024 7 _ |2 pmid
|a pmid:18507415
024 7 _ |2 DOI
|a 10.1021/la800728x
024 7 _ |2 WOS
|a WOS:000257101100036
037 _ _ |a PreJuSER-62546
041 _ _ |a eng
082 _ _ |a 670
084 _ _ |2 WoS
|a Chemistry, Multidisciplinary
084 _ _ |2 WoS
|a Chemistry, Physical
084 _ _ |2 WoS
|a Materials Science, Multidisciplinary
100 1 _ |a Gordan, O. D.
|b 0
|0 P:(DE-HGF)0
245 _ _ |a On Pattern Transfer in Replica Molding
260 _ _ |a Washington, DC
|b ACS Publ.
|c 2008
300 _ _ |a 6636 - 6639
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|0 0
|2 EndNote
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
440 _ 0 |a Langmuir
|x 0743-7463
|0 4081
|v 24
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a Nano- and micromolding of elastic materials produces smoothed replicas of the mold structures. This limits the technique's resolution. Here we identified surface tension as the cause of smoothing and derived explicit equations for calculating molded feature shapes. The characteristic length scale for smoothing is given by the ratio of the interface tension to Young's modulus of the molded material. This approach offers the possibility to correct for the smoothing caused by surface tension during mold design. Moreover, it can be exploited to measure interface tension.
536 _ _ |a Grundlagen für zukünftige Informationstechnologien
|c P42
|2 G:(DE-HGF)
|0 G:(DE-Juel1)FUEK412
|x 0
536 _ _ |a Kondensierte Materie
|c P54
|0 G:(DE-Juel1)FUEK414
|x 1
588 _ _ |a Dataset connected to Web of Science, Pubmed
650 _ 7 |a J
|2 WoSType
700 1 _ |a Persson, B. N. J.
|b 1
|0 P:(DE-HGF)0
700 1 _ |a Cesa, C. M.
|b 2
|u FZJ
|0 P:(DE-Juel1)VDB57503
700 1 _ |a Mayer, D.
|b 3
|u FZJ
|0 P:(DE-Juel1)128707
700 1 _ |a Hoffmann, B.
|b 4
|u FZJ
|0 P:(DE-Juel1)VDB27696
700 1 _ |a Dieluweit, S.
|b 5
|u FZJ
|0 P:(DE-Juel1)VDB5493
700 1 _ |a Merkel, R.
|b 6
|u FZJ
|0 P:(DE-Juel1)128833
773 _ _ |a 10.1021/la800728x
|g Vol. 24, p. 6636 - 6639
|p 6636 - 6639
|q 24<6636 - 6639
|0 PERI:(DE-600)2005937-1
|t Langmuir
|v 24
|y 2008
|x 0743-7463
856 7 _ |u http://dx.doi.org/10.1021/la800728x
909 C O |o oai:juser.fz-juelich.de:62546
|p VDB
913 1 _ |k P42
|v Grundlagen für zukünftige Informationstechnologien
|l Grundlagen für zukünftige Informationstechnologien (FIT)
|b Schlüsseltechnologien
|0 G:(DE-Juel1)FUEK412
|x 0
913 1 _ |k P54
|v Kondensierte Materie
|l Kondensierte Materie
|b Materie
|z entfällt bis 2009
|0 G:(DE-Juel1)FUEK414
|x 1
914 1 _ |y 2008
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
920 1 _ |k IBN-2
|l Bioelektronik
|d 31.12.2010
|g IBN
|0 I:(DE-Juel1)IBN-2-20090406
|x 0
920 1 _ |k CNI
|l Center of Nanoelectronic Systems for Information Technology
|d 14.09.2008
|g CNI
|z 381
|0 I:(DE-Juel1)VDB381
|x 1
920 1 _ |k IBN-4
|l Biomechanik
|d 31.12.2010
|g IBN
|0 I:(DE-Juel1)VDB802
|x 2
920 1 _ |k IFF-1
|l Quanten-Theorie der Materialien
|d 31.12.2010
|g IFF
|0 I:(DE-Juel1)VDB781
|x 3
970 _ _ |a VDB:(DE-Juel1)99000
980 _ _ |a VDB
980 _ _ |a ConvertedRecord
980 _ _ |a journal
980 _ _ |a I:(DE-Juel1)IBN-2-20090406
980 _ _ |a I:(DE-Juel1)VDB381
980 _ _ |a I:(DE-Juel1)ICS-7-20110106
980 _ _ |a I:(DE-Juel1)PGI-1-20110106
980 _ _ |a UNRESTRICTED
981 _ _ |a I:(DE-Juel1)IBI-2-20200312
981 _ _ |a I:(DE-Juel1)VDB381
981 _ _ |a I:(DE-Juel1)ICS-7-20110106
981 _ _ |a I:(DE-Juel1)PGI-1-20110106

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