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000062884 1001_ $$0P:(DE-HGF)0$$aClemens, S.$$b0
000062884 245__ $$aDirect electrical characterization of embedded ferroelectric lead titanate nanoislands
000062884 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2008
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000062884 520__ $$aWe report on the fabrication and characterization of lead titanate nanoislands on platinized silicon substrates embedded into a low-k dielectric. Our findings with Pt and Au as collective top electrodes are compared to previous results and thin films, and we discuss the coercive field and the remanent polarization with special care devoted to capacitive and leakage contributions of the nonpolar matrix. A direct electrical characterization of sub-100-nm ferroelectric nanoislands becomes feasible if they are measured in parallel, providing that the thin film material parameters of both ferroelectric and spin-on glass are independently determined. (c) 2008 American Institute of Physics.
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000062884 7001_ $$0P:(DE-HGF)0$$aDippel, A. C.$$b1
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000062884 7001_ $$0P:(DE-Juel1)VDB60095$$aRöhrig, S.$$b5$$uFZJ
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