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@ARTICLE{Clemens:62884,
author = {Clemens, S. and Dippel, A. C. and Schneller, T. and Waser,
R. and Rüdiger, A. and Röhrig, S.},
title = {{D}irect electrical characterization of embedded
ferroelectric lead titanate nanoislands},
journal = {Journal of applied physics},
volume = {103},
issn = {0021-8979},
address = {Melville, NY},
publisher = {American Institute of Physics},
reportid = {PreJuSER-62884},
pages = {034113},
year = {2008},
note = {Record converted from VDB: 12.11.2012},
abstract = {We report on the fabrication and characterization of lead
titanate nanoislands on platinized silicon substrates
embedded into a low-k dielectric. Our findings with Pt and
Au as collective top electrodes are compared to previous
results and thin films, and we discuss the coercive field
and the remanent polarization with special care devoted to
capacitive and leakage contributions of the nonpolar matrix.
A direct electrical characterization of sub-100-nm
ferroelectric nanoislands becomes feasible if they are
measured in parallel, providing that the thin film material
parameters of both ferroelectric and spin-on glass are
independently determined. (c) 2008 American Institute of
Physics.},
keywords = {J (WoSType)},
cin = {IFF-6 / JARA-FIT},
ddc = {530},
cid = {I:(DE-Juel1)VDB786 / $I:(DE-82)080009_20140620$},
pnm = {Grundlagen für zukünftige Informationstechnologien},
pid = {G:(DE-Juel1)FUEK412},
shelfmark = {Physics, Applied},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000253238100061},
doi = {10.1063/1.2838346},
url = {https://juser.fz-juelich.de/record/62884},
}