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024 7 _ |a 10.1063/1.2838346
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041 _ _ |a eng
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|a Physics, Applied
100 1 _ |a Clemens, S.
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245 _ _ |a Direct electrical characterization of embedded ferroelectric lead titanate nanoislands
260 _ _ |a Melville, NY
|b American Institute of Physics
|c 2008
300 _ _ |a 034113
336 7 _ |a Journal Article
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336 7 _ |a article
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440 _ 0 |a Journal of Applied Physics
|x 0021-8979
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|v 103
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a We report on the fabrication and characterization of lead titanate nanoislands on platinized silicon substrates embedded into a low-k dielectric. Our findings with Pt and Au as collective top electrodes are compared to previous results and thin films, and we discuss the coercive field and the remanent polarization with special care devoted to capacitive and leakage contributions of the nonpolar matrix. A direct electrical characterization of sub-100-nm ferroelectric nanoislands becomes feasible if they are measured in parallel, providing that the thin film material parameters of both ferroelectric and spin-on glass are independently determined. (c) 2008 American Institute of Physics.
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700 1 _ |a Dippel, A. C.
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700 1 _ |a Schneller, T.
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700 1 _ |a Waser, R.
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700 1 _ |a Rüdiger, A.
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700 1 _ |a Röhrig, S.
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773 _ _ |a 10.1063/1.2838346
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856 7 _ |u http://dx.doi.org/10.1063/1.2838346
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