%0 Journal Article
%A Asadchikov, Victor E.
%A Butashin, Andrey V.
%A Buzmakov, Alexey V.
%A Deryabin, Alexander N.
%A Kanevsky, Vladimir M.
%A Prokhorov, Igor A.
%A Roshchin, Boris S.
%A Volkov, Yuri O.
%A Zolotov, Denis A.
%A Jafari, Atefeh
%A Alexeev, Pavel
%A Cecilia, Angelica
%A Baumbach, Tilo
%A Bessas, Dimitrios
%A Danilewsky, Andreas N.
%A Sergueev, Ilya
%A Wille, Hans-Christian
%A Hermann, Raphael
%T Single-crystal sapphire microstructure for high-resolution synchrotron X-ray monochromators
%J Crystal research and technology
%V 51
%N 4
%@ 0232-1300
%C Weinheim
%I Wiley-VCH
%M FZJ-2016-02154
%P 290–298
%D 2016
%X We report on the growth and characterization of sapphire single crystals for X-ray optics applications. Structural defects were studied by means of laboratory double-crystal X-ray diffractometry and white-beam synchrotron-radiation topography. The investigations confirmed that the main defect types are dislocations. The best quality crystal was grown using the Kyropoulos technique. Therein the dislocation density was 102–103 cm−2 and a small area with approximately 2*2 mm2 did not show dislocation contrast in many reflections. This crystal has suitable quality for application as a backscattering monochromator. A clear correlation between growth rate and dislocation density is observed, though growth rate is not the only parameter impacting the quality.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000374323000005
%R 10.1002/crat.201500343
%U https://juser.fz-juelich.de/record/807736