TY  - JOUR
AU  - Asadchikov, Victor E.
AU  - Butashin, Andrey V.
AU  - Buzmakov, Alexey V.
AU  - Deryabin, Alexander N.
AU  - Kanevsky, Vladimir M.
AU  - Prokhorov, Igor A.
AU  - Roshchin, Boris S.
AU  - Volkov, Yuri O.
AU  - Zolotov, Denis A.
AU  - Jafari, Atefeh
AU  - Alexeev, Pavel
AU  - Cecilia, Angelica
AU  - Baumbach, Tilo
AU  - Bessas, Dimitrios
AU  - Danilewsky, Andreas N.
AU  - Sergueev, Ilya
AU  - Wille, Hans-Christian
AU  - Hermann, Raphael
TI  - Single-crystal sapphire microstructure for high-resolution synchrotron X-ray monochromators
JO  - Crystal research and technology
VL  - 51
IS  - 4
SN  - 0232-1300
CY  - Weinheim
PB  - Wiley-VCH
M1  - FZJ-2016-02154
SP  - 290–298
PY  - 2016
AB  - We report on the growth and characterization of sapphire single crystals for X-ray optics applications. Structural defects were studied by means of laboratory double-crystal X-ray diffractometry and white-beam synchrotron-radiation topography. The investigations confirmed that the main defect types are dislocations. The best quality crystal was grown using the Kyropoulos technique. Therein the dislocation density was 102–103 cm−2 and a small area with approximately 2*2 mm2 did not show dislocation contrast in many reflections. This crystal has suitable quality for application as a backscattering monochromator. A clear correlation between growth rate and dislocation density is observed, though growth rate is not the only parameter impacting the quality.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000374323000005
DO  - DOI:10.1002/crat.201500343
UR  - https://juser.fz-juelich.de/record/807736
ER  -