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100 1 _ |a Asadchikov, Victor E.
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245 _ _ |a Single-crystal sapphire microstructure for high-resolution synchrotron X-ray monochromators
260 _ _ |a Weinheim
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520 _ _ |a We report on the growth and characterization of sapphire single crystals for X-ray optics applications. Structural defects were studied by means of laboratory double-crystal X-ray diffractometry and white-beam synchrotron-radiation topography. The investigations confirmed that the main defect types are dislocations. The best quality crystal was grown using the Kyropoulos technique. Therein the dislocation density was 102–103 cm−2 and a small area with approximately 2*2 mm2 did not show dislocation contrast in many reflections. This crystal has suitable quality for application as a backscattering monochromator. A clear correlation between growth rate and dislocation density is observed, though growth rate is not the only parameter impacting the quality.
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700 1 _ |a Butashin, Andrey V.
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700 1 _ |a Buzmakov, Alexey V.
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700 1 _ |a Deryabin, Alexander N.
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700 1 _ |a Baumbach, Tilo
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700 1 _ |a Bessas, Dimitrios
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700 1 _ |a Danilewsky, Andreas N.
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700 1 _ |a Sergueev, Ilya
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700 1 _ |a Wille, Hans-Christian
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700 1 _ |a Hermann, Raphael
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Marc 21