Hauptseite > Publikationsdatenbank > Single-crystal sapphire microstructure for high-resolution synchrotron X-ray monochromators > print |
001 | 807736 | ||
005 | 20240529111642.0 | ||
024 | 7 | _ | |a 10.1002/crat.201500343 |2 doi |
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024 | 7 | _ | |a 0232-1300 |2 ISSN |
024 | 7 | _ | |a 1521-4079 |2 ISSN |
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082 | _ | _ | |a 540 |
100 | 1 | _ | |a Asadchikov, Victor E. |0 P:(DE-HGF)0 |b 0 |
245 | _ | _ | |a Single-crystal sapphire microstructure for high-resolution synchrotron X-ray monochromators |
260 | _ | _ | |a Weinheim |c 2016 |b Wiley-VCH |
336 | 7 | _ | |a Journal Article |b journal |m journal |0 PUB:(DE-HGF)16 |s 1461137836_9241 |2 PUB:(DE-HGF) |
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520 | _ | _ | |a We report on the growth and characterization of sapphire single crystals for X-ray optics applications. Structural defects were studied by means of laboratory double-crystal X-ray diffractometry and white-beam synchrotron-radiation topography. The investigations confirmed that the main defect types are dislocations. The best quality crystal was grown using the Kyropoulos technique. Therein the dislocation density was 102–103 cm−2 and a small area with approximately 2*2 mm2 did not show dislocation contrast in many reflections. This crystal has suitable quality for application as a backscattering monochromator. A clear correlation between growth rate and dislocation density is observed, though growth rate is not the only parameter impacting the quality. |
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700 | 1 | _ | |a Deryabin, Alexander N. |0 P:(DE-HGF)0 |b 3 |
700 | 1 | _ | |a Kanevsky, Vladimir M. |0 P:(DE-HGF)0 |b 4 |
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700 | 1 | _ | |a Cecilia, Angelica |0 P:(DE-HGF)0 |b 11 |
700 | 1 | _ | |a Baumbach, Tilo |0 P:(DE-HGF)0 |b 12 |
700 | 1 | _ | |a Bessas, Dimitrios |0 P:(DE-HGF)0 |b 13 |
700 | 1 | _ | |a Danilewsky, Andreas N. |0 P:(DE-HGF)0 |b 14 |
700 | 1 | _ | |a Sergueev, Ilya |0 P:(DE-HGF)0 |b 15 |
700 | 1 | _ | |a Wille, Hans-Christian |0 P:(DE-HGF)0 |b 16 |
700 | 1 | _ | |a Hermann, Raphael |0 P:(DE-Juel1)130706 |b 17 |e Corresponding author |
773 | _ | _ | |a 10.1002/crat.201500343 |g p. n/a - n/a |0 PERI:(DE-600)1480828-6 |n 4 |p 290–298 |t Crystal research and technology |v 51 |y 2016 |x 0232-1300 |
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